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AT5510N-GRE 参数 Datasheet PDF下载

AT5510N-GRE图片预览
型号: AT5510N-GRE
PDF下载: 下载PDF文件 查看货源
内容描述: 120毫安,吸收电流, 10位I2C DAC用于VCM驱动器 [120mA, Current Sinking, 10-bit I2C DAC for VCM Driver]
分类和应用: 驱动器
文件页数/大小: 12 页 / 208 K
品牌: AIMTRON [ AIMTRON TECHNOLOGY ]
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AT5510  
Preliminary Product Information  
120mA, Current Sinking,  
10-bit I2C DAC for VCM Driver  
Terminology  
z
Resolution  
Resolution of DAC is the number of bits to present the analog output signal.  
z
Integral nonlinearity (INL)  
Integral nonlinearity is a measurement of the maximum deviation, in LSB, from a straight line  
passing through the endpoints of the DAC transfer function. A typical INL vs. code plot is shown in  
Figure 3.  
z
z
z
z
Differential nonlinearity (DNL)  
Differential nonlinearity is the difference between the measured and ideal 1 LSB change by any  
two adjacent code. A typical DNL vs. code plot is shown in Figure 4.  
Zero-code error  
Zero-code error is a measurement of the output error when zero code (0x0000) is loaded to the  
DAC register. The zero-code error is positive in AT5510.  
Gain error  
Gain error is a measurement of the span error of the DAC. It is the deviation in slope of the DAC  
transfer characteristic from the ideal, expressed as percent of the full-scale range.  
Offset error  
Offset error is a measurement of the difference between actual output current (ISINK) and ideal  
output current (Io). It is measured on the AT5510 with Code 16 loaded into the DAC register.  
2F, No.10, Prosperity RD. II, Science-Based Industrial Park, Hsinchu 300,Taiwan, R.O.C.  
Tel: 886-3-563-0878  
9/20/2007 REV:0.2  
Fax: 886-3-563-0879  
WWW: http://www.aimtron.com.tw  
Email: service@aimtron.com.tw  
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