Notes:
1. HP recommends the use of non-
chlorine activated fluxes.
2. If V
IN-
is brought above V
DD1
-2 V with
respect to GND1 an internal test mode
may be activated. This test mode is not
intended for customer use.
3. Exact offset value is dependent on
layout of external bypass capacitors.
The offset value in the data sheet
corresponds to HP’s recommended
layout (see Figures 26 and 27).
4. Data sheet value is the average
magnitude of the difference in offset
voltage from T
A
= 25°C to T
A
= 100°C,
expressed in microvolts per
°C.
5. Nonlinearity is defined as half of the
peak-to-peak deviation from the best-
fit gain line, expressed as a percentage
of the full-scale differential output
voltage.
6. Because of the switched-capacitor
nature of the input sigma-delta A/D
converter, time-averaged values are
shown.
7. When the differential input signal
exceeds approximately 320 mV, the
outputs will limit at the typical values
shown.
8. Short-circuit current is the amount of
output current generated when either
output is shorted to V
DD2
or ground.
9. IMR (also known as CMR or Common
Mode Rejection) specifies the mini-
mum rate of rise of an isolation mode
noise signal at which small output
perturbations begin to appear. These
output perturbations can occur with
both the rising and falling edges of the
isolation mode waveform and may be
of either polarity. A CMR failure is
defined as a perturbation exceeding
200 mV at the output of the recom-
mended application circuit (Figure
24). See applications section for more
information on CMR.
10. IMRR is defined as the ratio of
differential signal gain (signal applied
differentially between pins 2 and 3) to
the isolation mode gain (input pins
tied to pin 4 and the signal applied
between the input and the output of
the isolation amplifier) at 60 Hz,
expressed in dB.
11. Output noise comes from two primary
sources: chopper noise and sigma-
delta quantization noise. Chopper
noise results from chopper stabiliza-
tion of the output op-amps. It occurs at
a specific frequency (typically
500 kHz) and is not attenuated by the
on-chip output filter. The on-chip filter
does eliminate most, but not all, of the
sigma-delta quantization noise. An
external filter circuit may be easily
added to the external post-amplifier to
reduce the total RMS output noise. See
applications section for more
information.
12. Data sheet value is the amplitude of
the transient at the differential output
of the HCPL-7820/7825 when a 1 V ,
p-p
1 MHz square wave with 200 ns rise
and fall times (measured at pins 1 and
8) is applied to both V
DD1
and V
DD2
.
13. This is a two-terminal measurement:
pins 1-4 are shorted together and pins
5-8 are shorted together.
14. In accordance with UL 1577, for
devices with minimum V
ISO
specified at
3750 V rms, each optocoupler is
proof-tested by applying an insulation
test voltage greater than 4500 V rms
for one second (leakage current
detection limit I
I-O
< 5
µA).
This test is
performed before the method b, 100%
production test for partial discharge
shown in the VDE 0884 Insulation
Characteristics Table.
1-240
AGILENT [ AGILENT TECHNOLOGIES, LTD. ]
