Typical Characteristics
All typical values are at T
A
= 25°C, V
CC
= 5 V, unless otherwise specified.
Parameter
Input Capacitance
Input Diode Temperature Coefficient
Resistance (Input-Output)
Capacitance (Input-Output)
Transistor DC Current Gain
Small Signal Current Transfer Ratio
Common Mode Transient Immunity
at Logic High Level Output
Common Mode Transient Immunity
at Logic Low Level Output
Bandwidth
Symbol
C
IN
∆V
F
/∆T
A
R
I-O
C
I-O
h
FE
∆I
O
/∆I
F
|CM
H
|
Test Conditions
V
F
= 0 V, f = 1 MHz
I
F
= 20 mA
V
I-O
= 500 V
f = 1 MHz
V
O
= 5 V, I
O
= 3 mA
V
CC
= 5 V, V
O
= 2 V
I
F
= 0 mA, R
L
= 8.2 kΩ,
V
O
(min) = 2.0 V,
V
CM
= 10 V
P-P
I
F
= 16 mA, R
L
= 8.2 kΩ,
V
O
(max) = 0.8 V,
V
CM
= 10 V
P-P
Typ.
60
-1.5
10
12
1.0
250
21
1000
Units
pF
mV/°C
Ω
pF
-
%
V/µs
7
10
Fig.
Notes
1
1
3
1, 11
1
1
1, 7
|CM
L
|
-1000
V/µs
10
1, 7
BW
9
MHz
8
8
Multi-Channel Product Only
Parameter
Input-Input Insulation Leakage Current
Resistance (Input-Input)
Capacitance (Input-Input)
Symbol
I
I-I
R
I-I
C
I-I
Test Conditions
RH
≤
65%, V
I-I
= 500 V, t = 5 s
V
I-I
= 500 V
f=1 MHz
Typ.
1
10
12
0.8
Units
pA
Ω
pF
Notes
5, 9
5
5
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio
of output collector current, I
O
, to the
forward LED input current, I
F
, times 100%.
CTR is known to degrade slightly over the
unit’s lifetime as a function of input current,
temperature, signal duty cycle, and system
on time. Refer to Application Note 1002 for
more detail. ln short, it is recommended that
designers allow at least 20-25% guardband
for CTR degradation.
3. All devices are considered two-terminal
devices; measured between all input leads
or terminals shorted together and all output
leads or terminals shorted together.
4. The 4N55, 4N55/883B, HCPL-257K, HCPL-
6530, HCPL-6531, and HCPL-653K dual
channel parts function as two independent
single channel units. Use the single channel
parameter limits. I
F
= 0 mA for channel
under test and I
F
= 20 mA for other
channels.
5. Measured between adjacent input pairs
shorted together for each multichannel
device.
6. t
PHL
propagation delay is measured from the
50% point on the leading edge of the input
pulse to the 1.5 V point on the leading edge
of the output pulse. The t
PLH
propagation
delay is measured from the 50% point on the
trailing edge of the input pulse to the 1.5 V
point on the trailing edge of the output
pulse.
7. CM
L
is the maximum rate of rise of the
common mode voltage that can be
sustained with the output voltage in the
logic low state (V
O
< 0.8 V). CM
H
is the
maximum rate of fall of the common mode
voltage that can be sustained with the
output voltage in the logic high state (V
O
>
2.0 V).
8. Bandwidth is the frequency at which the ac
output voltage is 3 dB below the low
frequency asymptote. For the HCPL-5530
the typical bandwidth is 2 MHz.
9. This is a momentary withstand test, not an
operating condition.
10. Higher CTR minimums are available to
support special applications.
11. Measured between each input pair shorted
together and all output connections for that
channel shorted together.
12. Standard parts receive 100% testing at 25°C
(Subgroups 1 and 9). SMD and 883B parts
receive 100% testing at 25, 125, and -55°C
(Subgroups 1 and 9, 2 and 10, 3 and 11,
respectively).
13. Not required for 4N55, 4N55/883B, HCPL-
257K, 5962-8767901, and 5962-8767905
types.
14. Required for 4N55, 4N55/883B, HCPL-257K,
5962-8767901, and 5962-8767905 types only.
9
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