ATF-511P8 Electrical Specifications
TA = 25°C, DC bias for RF parameters is Vds = 4.5V and Ids = 200 mA unless otherwise specified.
Symbol
Parameter and Test Condition
Units
Min.
Typ.
Max.
Vgs
Vth
Idss
Gm
Operational Gate Voltage
Threshold Voltage
Vds = 4.5V, Ids = 200 mA
Vds = 4.5V, Ids = 32 mA
Vds = 4.5V, Vgs = 0V
V
0.25
—
0.51
0.28
16.4
2178
0.8
—
—
—
V
Saturated Drain Current
Transconductance
µA
—
Vds = 4.5V, Gm = ∆Idss/∆Vgs;
∆Vgs = Vgs1 – Vgs2
Vgs1 = 0.55V, Vgs2 = 0.5V
mmho
—
Igss
NF
Gate Leakage Current
Noise Figure[1]
Vds = 0V, Vgs = -4.5V
µA
-27
-2
—
f = 2 GHz
f = 900 MHz
dB
dB
—
—
1.4
1.2
—
—
G
Gain[1]
f = 2 GHz
f = 900 MHz
dB
dB
13.5
—
14.8
17.8
16.5
—
OIP3
P1dB
PAE
Output 3rd Order Intercept Point[1,2]
Output 1dB Compressed[1]
Power Added Efficiency
f = 2 GHz
f = 900 MHz
dBm
dBm
38.5
—
41.7
43
—
—
f = 2 GHz
f = 900 MHz
dBm
dBm
28.5
—
30
29.6
—
—
f = 2 GHz
f = 900 MHz
%
%
52
—
68.9
68.6
—
—
ACLR
Notes:
Adjacent Channel Leakage
Power Ratio[1,3]
Offset BW = 5 MHz
Offset BW = 10 MHz
dBc
dBc
—
—
-58.9
-62.7
—
—
1. Measurements obtained using production test board described in Figure 6 and PAE tested at P1dB condition.
2. I ) 2 GHz OIP3 test condition: F1 = 2.0 GHz, F2 = 2.01 GHz and Pin = -5 dBm per tone.
II ) 900 MHz OIP3 test condition: F1 = 900 MHz, F2 = 910 MHz and Pin = -5 dBm per tone.
3. ACLR test spec is based on 3GPP TS 25.141 V5.3.1 (2002-06)
- Test Model 1
- Active Channels: PCCPCH + SCH + CPICH + PICH + SCCPCH + 64 DPCH (SF=128)
- Freq = 2140 MHz
- Pin = -5 dBm
- Channel Integrate Bandwidth = 3.84 MHz
4. Use proper bias, board, heatsink and derating designs to ensure maximum channel temperature is not exceeded. See absolute maximum ratings and
application note for more details.
50 Ohm
Transmission
Line and
Gate Bias T
(0.3 dB loss)
Input
Output
50 Ohm
Transmission
Line and
Drain Bias T
(0.3 dB loss)
Input
Output
Matching Circuit
Γ_mag = 0.69
Γ_ang = -164°
(1.1 dB loss)
Matching Circuit
Γ_mag = 0.65
Γ_ang = -163°
(0.9 dB loss)
DUT
Figure 6. Block diagram of the 2 GHz production test board used for NF, Gain, OIP3 , P1dB and PAE and ACLR measurements. This circuit achieves a
trade-off between optimal OIP3, P1dB and VSWR. Circuit losses have been de-embedded from actual measurements.
3
AGILENT [ AGILENT TECHNOLOGIES, LTD. ]
