10
D.U.T.
5 V
V
CC
PULSE
GENERATOR
R
L
I
F
V
O
Z
t
= 50 Ω
= 5 ns
O
H
0.01 µF
BYPASS
V
O
C *
L
INPUT
MONITORING
NODE
GND
Rm
* C INCLUDES PROBE AND STRAY WIRING CAPACITANCE.
L
Figure 5. Propagation Delay, t
PLH
and
PHL
t
vs. Pulse Input Current, I
.
FH
Figure 4. Test Circuit for t
and t
.*
PLH
PHL
D.U.T.
+5 V
B
V
CC
510 Ω
I
I
A
OUTPUT V
MONITORING
NODE
O
0.01 µF
BYPASS
GND
–
V
FF
V
CM
+
PULSE GEN.
Figure 6. Propagation Delay vs.
Temperature.
Figure 7. Test Circuit for Common Mode Transient Immunity
and Typical Waveforms.