Data Sheet
May 2001
L8576B Dual Ringing SLIC
Test Configurations
VBAT
VCC
0.1 µF
0.1 µF
VBAT
PT
BGND VCC AGND
RGX3
10 kΩ
CTG
100 pF
RGX2
RGX1
TIP
TG1
TG2
16.9 kΩ 7.5 kΩ
0.22 µF
RPT
25 Ω
RLOOP
600 Ω
VITR
XMT
RPR
RT1
127 kΩ
25 Ω
PR
RRCV
442 kΩ
RING
L8576
SLIC
RCVP
RCVN
RCV
DCOUT
IPROG
RG
88.7 kΩ
RPROG
51.1 kΩ
RTTH
RTTH
RTFLT
52.3 kΩ
RTFLT
383 kΩ
RNGNG
B2
RPWR
VBAT
RPWR
RRNG
NSTAT
2.2 kΩ
0.056 µF
0.1 µF
CF1
CF2
CF1
0.22 µF
RRNG
28.7 kΩ
CF2
0.22 µF
12-3360(F)a
Figure 5. Basic Test Circuit
VBAT OR VCC
VBAT OR VCC
DISCONNECT
BYPASS CAPACITOR
100 Ω
4.7 µF
100 Ω
4.7 µF
DISCONNECT
BYPASS CAPACITOR
VS
VS
VBAT OR
VCC
VBAT OR
VCC
67.5 Ω
PT
PR
PT
10 µF
BASIC
TEST CIRCUIT
+
BASIC
TEST CIRCUIT
900 Ω
VT/R
67.5 Ω
56.3 Ω
+
–
VM
–
PR
10 µF
VS
VM
VS
VT/R
PSRR = 20log
PSRR = 20log
12-2583a(F)
12-2582a(F)
Figure 7. Longitudinal PSRR
Agere Systems Inc.
Figure 6. Metallic PSRR
14
AGERE [ AGERE SYSTEMS ]
