NetLight
1417G5 and 1417H5-Type
ATM/SONET/SDH Transceivers with Clock Recovery
Data Sheet
January 2000
Qualification and Reliability
To help ensure high product reliability and customer satisfaction, Agere Systems is committed to an intensive qual-
ity program that starts in the design phase and proceeds through the manufacturing process. Optoelectronic mod-
ules are qualified to Agere Systems internal standards using MIL-STD-883 test methods and procedures and using
sampling techniques consistent with
Telcordia Technologies
requirements. The 1417 transceiver is required to pass
an extensive and rigorous set of qualification tests.
This qualification program fully meets the intent of
Telcordia Technologies
reliability practices TR-NWT-000468 and
TA-TSY-000983 requirements. In addition, the design, development, and manufacturing facilities of Agere Systems
Optoelectronics unit have been certified to be in full compliance with the latest
ISO
®
9001 quality system stan-
dards.
Electrical Schematic
B
MON–
B
MON+
P
MON–
P
MON+
17 18 19 20
15
Ω
10
Ω
15
Ω
15
Ω
TD–
TRANSMITTER
DRIVER
TD+
T
DIS
V
CCT
SFF TRANSCEIVER
V
CCR
7
C2
C3
15
14
13
11
C4
L2
V
CC
C5
L1
C1
15
Ω
200
Ω
V
EET
12, 16
V
PD
RD+
PREAMP
RECEIVER
POST-
AMPLIFIER/
CDR
RD–
CLK+
CLK–
SD
V
EER
1
10
9
5
4
8
2, 3, 6
L1 = L2 = 1
µH—4.7 µH*
C1 = C2 = 10 nF
†
C3 = 4.7
µF—10 µF
C4 = C5 = 4.7
µF—10 µF
1-968(F).b
* Ferrite beads can be used as an option.
† For all capacitors, MLC caps are recommended.
Figure 3. Power Supply Filtering for the Small Form Factor Transceiver
6
Agere Systems Inc.
AGERE [ AGERE SYSTEMS ]
