DAC8562–Typical Performance Characteristics
DAC8562
10
OUTPUT NOISE DENSITY – µV/ Hz
5
OUTPUT VOLTAGE CHANGE – mV
8
V
DD
= +5V
DATA = FFF
READINGS NORMALIZED
TO ZERO HOUR TIME POINT
H
V
DD
= +5V
T
A
= 25
°
C
DATA = FFF
H
1
4
3
2
1
0
–1
–2
–3
–4
135 UNITS TESTED
0
7
SUPPLY CURRENT – mA
VDATA = +2.4V
NO LOAD
6
5
4
3
2
V
DD
= +4.75V
1
0
–50
V
DD
= +5.0V
V
DD
= +5.25V
RANGE
AVG
0.1
0.01
10
1k
10k
100
FREQUENCY – Hz
100k
–5
200
400
600
800
1000
HOURS OF OPERATION AT +125°C
1200
–25
0
25
50
75
TEMPERATURE –
°
C
100
125
Figure 20. Output Voltage Noise
Density vs. Frequency
Figure 21. Long-Term Drift
Accelerated by Burn-In
Figure 22. Supply Current vs.
Temperature
10
DATA
2V
100
90
A4 0.040 V
DLY
1
100
13.82
µs
8
AVG +1σ
6
V
REF OUT
ERROR –mV
4
2
0
–2
–4
–6
–8
–10
–50
AVG –1σ
V
DD
= +5V
SAMPLE SIZE = 300
X
CE = HIGH
0
90
V
DD
0V
V
REF
0V
10
0%
T
A
= +25
°
C
R
L
=
∞
V
OUT
5mV/DIV
10
0%
2V
1µs
5V
5mV
Bw
L
5µs
TIME = 1µs/DIV
TIME = 20µs/DIV
–25
0
25
50
75
100
125
TEMPERATURE –
°
C
Figure 23. Reference Startup vs.
Time
Figure 24. Digital Feedthrough vs.
Time
Figure 25. Reference Error vs.
Temperature
0.005
0.10
REF LINE REGULATION – %/Volt
REF LOAD REGULATION – %/mA
0.004
AVG + 3
σ
0.08
V
DD
= +4.75 TO +5.25V
SAMPLE SIZE = 302 PCS
0.003
AVG
AVG – 3
σ
0.06
AVG + 3
σ
AVG
0.002
V
DD
= +5V
∆
IL = 5mA
SAMPLE SIZE = 302 PCS
–25
25
50
75
0
TEMPERATURE –
°
C
100
125
0.04
AVG – 3
σ
0.02
0.001
0.000
–50
0.00
–50
–25
0
25
50
75
100
125
TEMPERATURE –
°
C
Figure 26. Reference Load
Regulation vs. Temperature
Figure 27. Reference Line
Regulation vs. Temperature
–8–
REV. A
AD [ ANALOG DEVICES ]
