Table 18-4. AC Characteristics – RapidS/Serial Interface
AT45DB081D
(2.5V Version)
AT45DB081D
Typ
Symbol
fSCK
Parameter
Min
Typ
Max
50
Min
Max
66
Units
MHz
MHz
SCK Frequency
fCAR1
SCK Frequency for Continuous Array Read
50
66
SCK Frequency for Continuous Array Read
(Low Frequency)
fCAR2
33
33
MHz
tWH
tWL
SCK High Time
6.8
6.8
0.1
0.1
50
5
6.8
6.8
0.1
0.1
50
5
ns
ns
SCK Low Time
(1)
tSCKR
SCK Rise Time, Peak-to-Peak (Slew Rate)
SCK Fall Time, Peak-to-Peak (Slew Rate)
Minimum CS High Time
CS Setup Time
V/ns
V/ns
ns
(1)
tSCKF
tCS
tCSS
tCSH
tSU
ns
CS Hold Time
5
5
ns
Data In Setup Time
2
2
ns
tH
Data In Hold Time
3
3
ns
tHO
Output Hold Time
0
0
ns
tDIS
tV
Output Disable Time
27
35
8
27
35
6
ns
Output Valid
ns
tWPE
tWPD
tEDPD
tRDPD
tXFR
tcomp
WP Low to Protection Enabled
WP High to Protection Disabled
CS High to Deep Power-down Mode
CS High to Standby Mode
Page to Buffer Transfer Time
Page to Buffer Compare Time
1
1
μs
1
1
μs
3
3
μs
35
200
200
35
200
200
μs
μs
μs
Page Erase and Programming Time
(256-/264-bytes)
tEP
14
35
14
35
ms
tP
Page Programming Time (256-/264-bytes)
Page Erase Time (256-/264-bytes)
Block Erase Time (2,048-/2,112-bytes)
Sector Erase Time (65,536/67,584)
Chip Erase Time
2
13
30
0.7
7
4
2
13
30
0.7
7
4
ms
ms
ms
s
tPE
tBE
tSE
tCE
tRST
tREC
32
75
1.3
22
32
75
1.3
22
s
RESET Pulse Width
10
10
μs
μs
RESET Recovery Time
1
1
34
AT45DB081D
3596O–DFLASH–1/2013