ADM2485
TEST CIRCUITS
R
V
OD
R
04604-005
Preliminary Technical Data
A
R
LDIFF
V
OC
C
L1
C
L2
04736-005
B
Figure 3. Driver Voltage Measurement
Figure 7. Driver Propagation Delay
375Ω
DE 150Ω
V
OD3
60Ω
V
TST
04604-006
RTS
GALVANIC ISOLATION
DE OUT
50pF
375Ω
TxD
Figure 4. Driver Voltage Measurement
RxD
RE
A
B
DE OUT
DE
GALVANIC ISOLATION
150Ω
04604-008
RTS
V
DD1
GND
1
V
DD2
GND
2
TxD
V
DD2
A
B
195Ω
Figure 8. RTS to DE OUT Propagation Delay
V
CC
A
110Ω
S1
B
04604-004
RxD
RE
V
DD1
GND
1
110Ω
195Ω
GND
2
TxD
S2
04604-009
50pF
V
OUT
V
DD2
GND
2
RTS
Figure 5. Supply-Current Measurement Test Circuit
A
Figure 9. Driver Enable/Disable
RTS
GALVANIC ISOLATION
DE
DE OUT
B
RE
V
OUT
04604-012
C
L
TxD
V
DD2
195Ω
B
A
110Ω 470nF
195Ω
GND
2
50Ω
22kΩ
50Ω
F
TEST
,
110nF V
HF
Figure 10. Receiver Propagation Delay
V
CM(HF)
RxD
2.2kΩ
RECEIVE
GND
2
ENABLE
V
DD1
100nF
+1.5V
S1
04604-010
V
CC
R
L
RE
C
L
V
OUT
GND
1
V
DD2
100nF
GND
2
V
TEST2
–1.5V
S2
04604-013
Figure 6. High Frequency Common-Mode Noise Test Circuit
RE IN
Figure 11. Receiver Enable/Disable
Rev. PrK | Page 8 of 15
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