ADG408/ADG409
SINGLE SUPPLY
1
Parameter
ANALOG SWITCH
Analog Signal Range
R
ON
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF)
Drain OFF Leakage I
D
(OFF)
ADG408
ADG409
Channel ON Leakage I
D
, I
S
(ON)
ADG408
ADG409
DIGITAL INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current
I
INL
or I
INH
C
IN
, Digital Input Capacitance
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
t
OPEN
t
ON
(EN)
t
OFF
(EN)
Charge Injection
OFF Isolation
Channel-to-Channel Crosstalk
C
S
(OFF)
C
D
(OFF)
ADG408
ADG409
C
D
, C
S
(ON)
ADG408
ADG409
POWER REQUIREMENTS
I
DD
I
DD
100
200
(V
DD
= +12 V, V
SS
= 0 V, GND = 0 V, unless otherwise noted)
B Version
–40 C to
+25 C
+85 C
0 to V
DD
90
±
0.5
±
1
±
1
±
1
±
1
±
50
±
100
±
50
±
100
±
50
2.4
0.8
±
10
8
130
10
140
60
5
–75
85
11
40
20
54
34
1
5
500
100
200
8
130
10
140
60
5
–75
85
11
40
20
54
34
1
5
500
90
±
0.5
±
1
±
1
±
1
±
1
±
50
±
100
±
50
±
100
±
50
2.4
0.8
±
10
T Version
–55 C to
+25 C +125 C
0 to V
DD
Units
V
Ω
typ
nA max
nA max
nA max
nA max
nA max
V min
V max
µA
max
pF typ
ns typ
ns typ
ns typ
ns typ
pC typ
dB typ
dB typ
pF typ
pF typ
pF typ
Test Conditions/Comments
V
D
= +3 V, +10 V, I
S
= –1 mA
V
D
=8 V/0 V, V
S
= 0 V/8 V;
Test Circuit 2
V
D
=8 V/0 V, V
S
= 0 V/8 V;
Test Circuit 3
V
S
= V
D
= 8 V/0 V;
Test Circuit 4
V
IN
= 0 or V
DD
f = 1 MHz
R
L
= 300
Ω,
C
L
= 35 pF;
V
S1
= 8 V/0 V, V
S8
= 0 V/8 V;
Test Circuit 5
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V; Test Circuit 6
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
V
S
= 0 V, R
S
= 0
Ω,
C
L
= 10 nF;
Test Circuit 8
R
L
= 1 kΩ, f = 100 kHz;
V
EN
= 0 V; Test Circuit 9
R
L
= 1 kΩ, f = 100 kHz;
Test Circuit 10
f = 1 MHz
f = 1 MHz
f = 1 MHz
pF typ
pF typ
µA
typ
µA
max
µA
typ
µA
max
V
IN
= 0 V, V
EN
= 0 V
V
IN
= 0 V, V
EN
= 2.4 V
NOTES
1
Temperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. A
–3–
AD [ ANALOG DEVICES ]
