AD9513
PHASE NOISE AND JITTER MEASUREMENT SETUPS
WENZEL
EVALUATION BOARD
OSCILLATOR
ZFL1000VH2
13
AD95
ATTENUATOR
–12dB
TERM
TERM
AMP
SIG IN
OUT1
CLK
B
OUT1
+28dB
SPLITTER
ZESC-2-11
0°
EVALUATION BOARD
ZFL1000VH2
513
AD9
ATTENUATOR
–7dB
TERM
TERM
AMP
REF IN
OUT1
CLK
OUT1B
+28dB
VARIABLE DELAY
COLBY PDL30A
0.01ns STEP
TO 10ns
Figure 33. Additive Phase Noise Measurement Configuration
WENZEL
OSCILLATOR
ANALOG
SOURCE
EVALUATION BOARD
PC
WENZEL
OSCILLATOR
13
OUT1
AD95
CLK
SNR
TERM
TERM
ADC
CLK
OUT1B
FFT
tJ_RMS
DATA CAPTURE CARD
FIFO
Figure 34. Jitter Determination by Measuring SNR of ADC
2
⎡
⎢
⎢
⎣
⎤
VA_RMS
2
2
2
2
⎥
⎥
⎦
−
(
SND × BW
)
−
(
θQUANTIZATION + θTHERMAL + θDNL
)
SNR
20
10
tJ_RMS
=
2
[
2π × fA ×VA_PK
]
where:
tj_RMS is the rms time jitter.
SNR is the signal-to-noise ratio.
SND is the source noise density in nV/√Hz.
BW is the SND filter bandwidth.
VA is the analog source voltage.
fA is the analog frequency.
The θ terms are the quantization, thermal, and DNL errors.
Rev. 0 | Page 25 of 28
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