AD8367
R7
SW2
10k⍀
TP1
V
P
C1
R6
R5
1F
AD8367
4.7⍀ 4.7⍀
C3
TP3
MODE
LK1
C2
0.1F
1
2
3
4
5
6
7
ICOM
14
13
12
11
10
9
ICOM
HPFL
VPSI
0.1F
R
, 0⍀
HP
R2
174⍀
ENBL
INPT
J1
C
, 10nF
HP
INPUT
R1
57.6⍀
TP4
GAIN
MODE
GAIN
DETO
ICOM
VPSO
VOUT
DECL
OCOM
J2
SW1
OUTPUT
C
0.1F
AGC
C5
10nF
R3
C4
R4
174⍀
8
57.6⍀
0.1F
Figure 16. Evaluation Board Schematic
Table III. Suggested Component Values For External AGC
Detector Circuit
Rate
Sym/s F
C1
C2
F
R2
k⍀
R3
k⍀
Modulation Type
QPSK
1.23 M 0.0022 0.033
4 M 0.0022 0.015
24.3 K 0.033
150
150
150
150
150
150
62
39
51
51
62
100
QPSK
π/4 DQPSK
64 QAM
0.68
1.5
100 K
500 K
4 M
0.015
64 QAM
0.0068 0.33
0.0022 0.068
64 QAM
Evaluation Board
Figure 16 shows the schematic of the AD8367 evaluation board.
The board is powered by a single supply of 2.7 V to 5.5 V. Table
IV details the various configuration options of the evaluation board.
Figure 18. Silkscreen of Component Side
Characterization Setup and Methods
Minimum-loss L-pad matching networks were used to interface
standard 50 Ω test equipment to the 200 Ω input impedance during
the characterization process. Using a 57.6 Ω shunt resistor followed
by a 174 Ω series resistor provides a broadband match between the
50 Ω test equipment and the 200 Ω device impedance as illustrated
in Figure 19. The insertion loss of this network is 11.5 dB.
AD8367
174⍀
174⍀
57.6⍀
57.6⍀
Figure 19. Characterization Test Setup
Figure 17. Layout of Component Side
REV. 0
–15–
ADI [ ADI ]
