TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C £ TA £ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Max
Unit
Test
Symbol
Min
Transient response 2/
rise time
TR(tr)
9,10,11
01
150
ns
±VS = ±15 V, RL = 2 kW,
CL = 100 pF, VIN = 50 mV,
AV = 1
02
100
40
Transient response 2/
overshoot
TR(os)
9,10,11
9
01,02
%
±VS = ±15 V, RL = 2 kW,
CL = 100 pF, VIN = 50 mV,
AV = 1
Settling time 2/
+ts,
-ts
All
1500
ns
±VS = ±15 V, 0.1 % error,
AV = -1
1/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation. However,
this device is only tested at the "R" level. Pre and Post irradiation values are identical unless otherwise specified
in table I. When performing post irradiation electrical measurements for any RHA level, TA = +25°C. ±VS = ±15 V.
2/ This parameter is not tested to post irradiation.
3/ Bias and offset currents are actually junction leakage currents which double (approximately) for each 10°C increase in
junction temperature (TJ). Measurement of bias and offset current is specified at TJ rather than TA, since normal warmup
thermal transients will affect the bias and offset currents. The measurements for bias currents must be made within
25 ms or 5 loop time constants which ever is greater, after power is first applied to the device for test. Measurement at
TA = -55°C is not necessary since expected values are too small for typical test systems.
4/ Bias current is sensitive to power supply voltage, common mode voltage and temperature.
5/ Negative IIB minimum limits reflect the characteristics of devices with bias current compensation.
6/ Continuous limits shall be considerably lower. Protection for shorts to either supply exists providing
that TJ(maximum) £ 175°C.
7/ Because of thermal feedback effects from output to input, open loop gain is not guaranteed to be linear or positive over
the operating range. These requirements, if needed, should be specified by the user in additional procurement
documents.
8/ CMR is calculated from VIO measurements at VCM = +15 V and -15 V.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein)
involving devices acquired to this drawing is required for any change as defined in MIL-STD-973.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available
onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 61 (see MIL-PRF-38535, appendix A).
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-98636
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
SHEET
A
7
DSCC FORM 2234
APR 97
ADI [ ADI ]
