TABLE I. Electrical performance characteristics - Continued.
Conditions 1/ 2/ 3/
-55C T +125C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits 4/
Unit
A
Min
Max
1
01
1000
800
500
1000
100
100
800
600
V/mV
A
VO
V
= 10 V, R 2 k
L
Large signal voltage gain
OUT
OUT
OUT
OUT
V
V
V
= 10 V, R 600
L
2,3
1
= 10 V, R 2 k
L
02, 03
02
= 10 V, R 2 k
L
M,D,P,L,R
M,D,P,L
1
1
03
1
02, 03
V
V
= 10 V, R 600
L
OUT
2,3
= 10 V, R 2 k
OUT
L
1/ Device 02 supplied to this drawing have been characterized through all levels M, D, P, L, R of irradiation.
Device 03 supplied to this drawing have been characterized through all levels P and L of irradiation.
However, device 02 is only tested at the “R” level and device type 03 is only tested at the “L” level. Pre and Post irradiation
values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for
any RHA level, T = +25C.
A
2/ Unless otherwise specified, V = 15 V and source resistance (R ) = 50 .
S
S
3/ The 02 device may be low dose rate sensitive in a space environment and may demonstrate enhanced low dose rate
effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in
MIL-STD-883, method 1019, condition A for device type 02. Device type 03, has been tested at low dose rate.
4/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used
in this table. Negative current shall be defined as conventional current flow out of a device terminal.
5/ This parameter is not tested post-irradiation.
6/ Input voltage range is defined as the V
range used for the CMRR test.
CM
7/ This test shall be 100% tested at preburn-in of interim electrical parameters and guaranteed to the limits specified in
table I herein.
SIZE
STANDARD
5962-94680
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
E
SHEET
COLUMBUS, OHIO 43218-3990
7
DSCC FORM 2234
APR 97
ADI [ ADI ]
