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5962L8856504VDA 参数 Datasheet PDF下载

5962L8856504VDA图片预览
型号: 5962L8856504VDA
PDF下载: 下载PDF文件 查看货源
内容描述: [Aerospace High Speed Low Noise Quad Op Amp]
分类和应用: 放大器
文件页数/大小: 13 页 / 75 K
品牌: ADI [ ADI ]
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3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535  
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of  
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see  
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of  
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of  
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.  
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for  
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.  
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of  
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.  
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,  
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore  
documentation shall be made available onshore at the option of the reviewer.  
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in  
microcircuit group number 49 (see MIL-PRF-38535, appendix A).  
4. VERIFICATION  
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with  
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan  
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in  
accordance with MIL-PRF-38535, appendix A.  
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted  
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in  
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.  
4.2.1 Additional criteria for device class M.  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision  
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
method 1015.  
(2) T = +125C, minimum.  
A
b. Interim and final electrical test parameters shall be as specified in table IIA herein.  
4.2.2 Additional criteria for device classes Q and V.  
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the  
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under  
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with  
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
method 1015 of MIL-STD-883.  
b. Interim and final electrical test parameters shall be as specified in table IIA herein.  
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in  
MIL-PRF-38535, appendix B.  
SIZE  
STANDARD  
5962-88565  
A
MICROCIRCUIT DRAWING  
DLA LAND AND MARITIME  
REVISION LEVEL  
SHEET  
COLUMBUS, OHIO 43218-3990  
H
8
DSCC FORM 2234  
APR 97