OP470–SPECIFICATIONS
WAFER TEST LIMITS (at VS = ꢂ15 V, 25ꢁC, unless otherwise noted.)
OP470GBC
Limit
Parameter
Symbol
Conditions
Unit
INPUT OFFSET VOLTAGE
VOS
0.8
20
50
mV Max
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
IOS
IB
VCM = 0 V
VCM = 0 V
nA Max
nA Min
LARGE-SIGNAL
Voltage Gain
VO = ±10 V
RL = 10 kW
RL = 2 kW
AVO
800
400
V/mV Min
INPUT VOLTAGE RANGE
*
IVR
VO
±11
±12
V Min
V Min
OUTPUT VOLTAGE SWING
RL ≥ 2 kW
COMMON-MODE
REJECTION
CMR
PSRR
ISY
VCM = ±11 V
VS = ±4.5 V to ±18 V
No Load
100
5.6
11
dB
POWER SUPPLY
REJECTION RATIO
mV/V Max
mA Max
SUPPLY CURRENT
(All Amplifiers)
NOTE
*
Guaranteed by CMR test
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaran-
teed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
–4–
REV. B
ADI [ ADI ]
