TABLE IIA. Electrical test requirements.
Subgroups
Test requirements
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
class M
---
Device
class Q
---
Device
class V
---
Interim electrical
parameters (see 4.2)
Final electrical
1,2,3,4,5,6 1/
1,2,3,4,5,6 1/ 1,2,3,4, 1/ 2/
5,6
parameters (see 4.2)
1,2,3,4,5,6
1,2,3,4,5,6
1,2,3,4,5,6
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1
1
1
1
1
2/
1
1
---
---
1/ PDA applies to subgroup 1. Deltas excluded from PDA.
2/ See table IIB for delta parameters. See table I for conditions.
Table IIB. 240 burn-in and group C end-point electrical parameters.
Parameter
Device types
Burn-in
Limit
Life test limit
Delta Limit
IQ
VOS
01, 02
01, 02
5.5 mA
±5.5 mV
6.0 mA
±7.5 mV
0.55 mA
±2.0 mV
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
SIZE
STANDARD
5962-94593
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
E
SHEET
COLUMBUS, OHIO 43218-3990
9
DSCC FORM 2234
APR 97
ADI [ ADI ]
