TABLE I. Electrical performance characteristics – Continued.
Conditions 1/ 2/
-55°C ≤ TA ≤+125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Max
Unit
Test
Symbol
Min
350
Large-signal voltage gain
AVS
4
02
V/mV
VO = ±10 V,
RL = 2 kΩ 3/
5, 6
4, 5, 6
1, 2, 3
1
250
Output voltage swing
Supply current 4/
VOP
IS
All
All
V
RL = 2 kΩ 3/
No load
±12
11
11
mA
M,D,P,L,R
Slew rate
SR
7
01
1.4
AVCL = +21, RL = 10 kΩ,
V/µs
TA = +25°C 3/
02
01
6.5
Common-mode rejection
CMR
1
2, 3
1
110
100
105
100
dB
VCM = IVR = ±11 V 3/ 5/
02
01
02
2, 3
1
Power supply rejection ratio PSRR
1.8
5.6
5.6
10
VCC = ±4.5 V to ±18 V 3/
µV/V
2, 3
1
2, 3
1/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, R of irradiation. However, this
device is only tested at the “R” level. Pre and Post irradiation values are identical unless otherwise specified in table I.
When performing post irradiation electrical measurements for any RHA level, TA = +25°C. VCC = ±15 V, RS = 50 Ω.
2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method
1019, condition A.
3/ This parameter is not tested post-irradiation.
4/ IS limit equals the total of all amplifiers.
5/ IVR is defined as the VCM range used for the CMR test.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
F
SHEET
6
DSCC FORM 2234
APR 97
ADI [ ADI ]
