ACT81460
Rev 1.0, 18-Dec-2018
ABSOLUTE MAXIMUM RATINGS (NOTE 1)
PARAMETER
VALUE
UNIT
All Pins to GND unless stated otherwise below
-0.3 to 6.0
-0.3 to 6.0
-0.3 to 22.0
-0.3 to 6.0
V
V
V
V
nPBIN/PWREN, GPIO 1,2,3 (nIRQ, nRESET, nCHGSTAT), ISET, NTC
VIN to PGNDx
VSYS(AVIN), VBAT, VINLx, VINLSx, VINBx, VINBB to PGNDx
OUTLS1,2,3 & OUTL1,2,3
VBBST
-0.3 to VSYS voltage
-0.3 to 6.0
V
V
SWBBx to PGNDx
-1.0 to VBBST + 1.0
-0.3 to 21
V
VBST
V
SWBST to PGNDx
VIN_IO
-1.0 to VBST + 1.0
-0.3 to 6.0
V
V
ISNS to PGNDx
-0.3 to VBST
-0.3 to VINBx
-1.0 to VINBx + 1
-0.3 to + 0.3
40
V
FBx to PGNDx
V
SWx to PGNDx
V
AGND, PGNDx
V
Junction to Ambient Thermal Resistance (Note 2)
Operating Ambient Temperature Range
Operating Junction Temperature
Storage Temperature
°C/W
°C
°C
°C
-40 to 85
-40 to 150
-55 to 150
Note1: Do not exceed these limits to prevent damage to the IC. Exposure to absolute maximum rating conditions for long periods may affect IC
reliability.
Note2: Measured on Active-Semi Evaluation Kit
ESD RATINGS
PARAMETER
VALUE
UNIT
TEST CONDITIONS
V_ESD_HMB (All pins)
V_ESD_CDM (All pins)
Human body Model per JEDEC JS-001
Charged device model per JEDEC JS-002
+/- 2000
+/- 1000
V
V
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