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A1280XL-FPGC 参数 Datasheet PDF下载

A1280XL-FPGC图片预览
型号: A1280XL-FPGC
PDF下载: 下载PDF文件 查看货源
内容描述: 集成系列FPGA : 1200XL和3200DX家庭 [Integrator Series FPGAs: 1200XL and 3200DX Families]
分类和应用:
文件页数/大小: 84 页 / 3116 K
品牌: ACTEL [ Actel Corporation ]
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Integrator Series FPGAs: 1200XL and 3200DX Families  
Table 1 IEEE 1149.1 BST Signals  
Table 2 BST Instructions  
Signal  
Name  
Function  
Test Mode  
Code  
Description  
Serial data input for BST instructions and  
data. Data is shifted in on the rising edge  
of TCK.  
Allows the external circuitry and  
board-level interconnections to be tested  
by forcing a test pattern at the output pins  
and capturing test results at the input  
pins.  
TDI  
Test Data In  
EXTEST  
000  
Serial data output for BST instructions  
and test data.  
TDO  
TMS  
TCK  
Test Data Out  
Test Mode Select  
Test Clock  
Allows a snapshot of the signals at the  
device pins to be captured and examined  
during device operation.  
SAMPLE/  
PRELOAD  
Serial data input for BST mode. Data is  
shifted in on the rising edge of TCK.  
001  
011  
100  
Clock signal to shift the BST data into  
the device.  
A private instruction allowing the user to  
connect Actel’s Micro Probe registers to  
the test chain.  
JPROBE  
JTAG  
Allows the user to build  
application-specific instructions such as  
RAM READ and RAM WRITE.  
USER  
INSTRUCTION  
All 3200DX devices are IEEE 1149.1 (JTAG) compliant.  
3200DX devices offer superior diagnostic and testing  
capabilities by providing JTAG and probing capabilites.  
These functions are controlled through the special JTAG  
pins in conjunction with the program fuse.  
Refer to the IEEE Standard 1149.1  
specification.  
HIGH Z  
CLAMP  
101  
110  
Refer to the IEEE Standard 1149.1  
specification.  
Enables the bypass register between the  
TDI and TDO pins. The test data passes  
through the selected device to adjacent  
devices in the test chain.  
JTAG fuse programmed:  
BYPASS  
111  
• TCK must be terminated—logical high or low doesn’t  
matter (to avoid floating input)  
JTAG BST Instructions  
• TDI, TMS may float or at logical high (internal pull-up is  
present)  
JTAG BST testing within the 3200DX devices is controlled  
by a Test Access Port (TAP) state machine. The TAP  
controller drives the three-bit instruction register, a bypass  
register, and the boundary scan data registers within the  
device. The TAP controller uses the TMS signal to control  
the JTAG testing of the device. The JTAG test mode is  
determined by the bitstream entered on the TMS pin. The  
table in the next column describes the JTAG instructions  
supported by the 3200DX.  
• TDO may float or connect to TDI of another device (it’s an  
output)  
JTAG fuse not programmed:  
• TCK, TDI, TDO, TMS are user I/O. If not used, they will be  
configured as tristated output.  
BST Instructions  
Boundary scan testing within the 3200DX devices is  
controlled by a Test Access Port (TAP) state machine. The  
TAP controller drives the three-bit instruction register, a  
bypass register, and the boundary scan data registers within  
the device. The TAP controller uses the TMS signal to  
control the testing of the device. The BST mode is  
determined by the bitstream entered on the TMS pin.  
Table 2 describes the test instructions supported by the  
3200DX devices.  
Design Tool Support ActionProbe  
If a device has been successfully programmed and the  
security fuse has not been programmed, any internal logic  
or I/O module output can be observed in real time using the  
ActionProbe circuitry, the PRA and/or PRB pins, and Actel’s  
Silicon Explorer diagnostic and debug tool kit.  
Reset  
The TMS pin is equipped with an internal pull-up resistor.  
This allows the TAP controller to remain in or return to the  
Test-Logic-Reset state when there is no input or when a  
logical 1 is on the TMS pin. To reset the controller, TMS  
must be HIGH for at least five TCK cycles.  
When a device is operating in BST mode, four I/O pins are  
used for the TDI, TDO, TMS, and TCLK signals. An active  
reset (nTRST) pin is not supported; however, the 3200DX  
contains power-on circuitry which automatically resets the  
BST circuitry upon power-up. The following table  
summarizes the functions of the BST signals.  
Discontinued – v3.0  
11  
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