TABLE IB. SEP test limits. 1/ 3/
Symbol
Characteristics
Upset Mode
Conditions
Bias
Effective LET
no upset
Saturated
X-section
VDD
=
(MeV-cm2/mg)
SEL
SEU
Single event latchup
Single event upset
all
C-Latch
1 MHz Clock 2/
all
5.5 V
4.5 V
5.0 V
5.5 V
>84
>8 3/
18.8
>40
N/A
1.5 x 10-6 cm2/bit
2.5 x 10-7 cm2/device
N/A
-55°C≤TC≤125°C
-55°C≤TC≤125°C
TA = +25°C
SEDR
4/
Single event dielectric
(antifuse) rupture
-55°C≤TC≤125°C
Notes:
1/. Verification test per TRB approved test plan.
2/. Clock upset causes upset in the clocked flip-flops, its rate is proportional to the clock frequency and can be computed
using the following;
3x10-8 upset/device-day ;
1 MHz
f x
Where f is the clock frequency of interest and 3 x 10-8 (upset/device-day) is the computed rate from the SEU testing data.
3/. Threshold LET at 1% saturated X-section is 13, and at 10%, saturated X-section is 25.
4/. Tested at worst case that ions have perpendicular incidence.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document revision level control of the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in appendix B of
MIL-PRF-38535.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-
38535 including groups A, B, C, D, and E inspections and as specified herein except where option 2 of MIL-PRF-38535 permits
alternate in-line control testing. Quality conformance inspection for device class M shall be in accordance with MIL-STD-883
(see 3.1 herein) and as specified herein. Inspections to be performed for device class M shall be those specified in method
5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5 and 6 of table IA of method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C and C measurements) shall be measured only for initial qualification and after any process or design
I
O
changes which may affect input or output capacitance. A sample size of 5 devices with no failures, and all input and
output terminals shall be required.
d. O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document
revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon
request. For device classes Q and V, the procedures and circuits shall be under the control of the device manufacturer's
TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or acquiring activity upon
request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be considered destructive.
Information contained in JEDEC Standard EIA/JESD78 may be used for reference.
SIZE
STANDARD
5962-90965
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
7
DSCC FORM 2234
APR 97
ACTEL [ Actel Corporation ]
