1.3 Absolute maximum ratings. 2/
DC supply voltage range (VDD)-----------------------------
Input voltage range (VI) - ------------------------------------
Output voltage range (VO)-----------------------------------
I/O source sink current IIO) ---------------------------------
Storage temperature range (TSTG) -----------------------
Lead temperature (soldering, 10 seconds) -------------
Thermal resistance, junction-to-case (θJC)
Case outline X, Y, Z, U, T -----------------------------------
Case outline M ------------------------------------------------
Maximum junction temperature (TJ) ---------------------
-0.5 V dc to +7.0 V dc
-0.5 V dc to VDD + 0.5 V dc
-0.5 V dc to VDD + 0.5 V dc
±20 mA
-65°C to +150°C
300°C
See MIL-STD-1835
10°C/W 3/
+150°C
1.4 Recommended operating conditions.
Supply voltage (VDD)------------------------------------------
Case operating temperature range (TC) ----------------
+4.5 V dc to +5.5 V dc
-55°C to +125°C
1.5 Radiation features.
Maximum total dose available
(dose rate = 50 - 300 rads(Si)/s)------------------------------
300K rads(Si)
(maximum) 4/
1.6 Digital logic testing for device classes Q and V.
Fault coverage measurement of manufacturing
logic tests (MIL-STD-883, test method 5012)- - - - - - - - 100 percent 5/
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard For Microcircuit Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
3/ When a thermal resistance for this case is specified in MIL-STD-1835 that value shall supersede the value indicated herein.
4/ Device electrical characteristics are verified for post irradiation levels at 25°C per MIL-STD-883, Test method 1019, condition
A and post 168 hours, 100°C, biased anneal.
5/ 100 percent test coverage of blank programmable logic devices.
SIZE
STANDARD
5962-90965
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
3
DSCC FORM 2234
APR 97
ACTEL [ Actel Corporation ]
