MIL-PRF-38535K
INDEX
PARAGRAPH
Group A electrical testing
Group A electrical testing
Group A inspection
A.4.4.2.2
J.3.11.1
A.4.5.2
Group A inspection
F.4.7.1
Group A inspection
J.3.10.1
A.4.5.8.1
A.4.5.3
Group B failure
Group B inspection
Group B inspection
F.4.7.2
Group B inspection
J.3.10.2
A.4.4.2.3
A.4.5.8.3
F.4.7.3
Group B testing
Group C failure
Group C inspection
Group C inspection
J.3.10.3
A.4.5.4
Group C inspection for class level B only
Group C life tests
J.3.11.2
A.4.5.4.1
A.4.5.8.4
A.4.5.5
Group C sample selection
Group D failure
Group D inspection
Group D inspection
F.4.7.4
Group D inspection
J.3.10.4
A.4.5.5.1
A.4.5.6
Group D sample selection
Group E inspection
Group E inspection
J.3.10.5
A.4.5.6.1
A.4.4.2.5
A.4.4.2.4
F.4.7.4.1
A.3.5.6.3.4
A.3.1.3.4.2
A.3.6.3
Group E sample selection
Group E testing
Groups C and D testing
Highly accelerated stress testing (HAST)
Hot solder dip
Hybrid microcircuit
Identification codes
In line TCI testing (option 2)
In line TCI testing (option 2)
Incoming vendor material control program
C.4.5
J.3.11
A.4.5.5.2
A.4.8.1.1.12
3.6.1
Incoming, in process, and outgoing inventory control
Index point
Index point
A.3.6.1
Initial documentation and subsequent changes in design,
materials, or processing
A.4.8.1.2.4
A.3.4.1.2.1
A.4.1.1
Inspection by scanning electron microscope (SEM)
Inspection during manufacture
Inspection lot
6.4.6
Inspection lot - class level B
Inspection lot - class level S
A.3.1.3.8
A.3.1.3.7
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ACTEL [ Actel Corporation ]
