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5962-9958502QXC 参数 Datasheet PDF下载

5962-9958502QXC图片预览
型号: 5962-9958502QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 36000 Gates, 2414-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX G  
G.3.4.4 Package change. Changes in the package qualification to be evaluated by the TRB shall include, but not  
be limited to, changes in the following areas:  
a. Vendor.  
b. External dimensions.  
c. Cavity dimensions.  
d. Number of leads or terminals.  
e. Lead or terminal dimensions (length times width or diameter).  
f. Lead or terminal base material.  
g. Lead or terminal plating material.  
h. Lead or terminal plating thickness (range of).  
i. Body material.  
j. Body plating material.  
k. Body plating thickness (range of).  
l. Die pad material.  
m. Die pad plating.  
n. Die pad plating thickness (range of).  
o. Lid material.  
p. Lid plating materials (range of).  
q. Lid plating thickness (range of).  
r. Lid seal (preform) material.  
s. Lid glass seal material.  
t. Lead glass seal material.  
u. Lead glass seal diameter (range of).  
v. Leads or terminals spacing.  
w. Lead configuration (e.g., J-lead, gull-wing).  
x. Die size.  
y. Device marking process.  
z. Lead attachment.  
G.3.4.5 Test facility change. Changes in the test facility to be evaluated by the TRB shall include, but not be  
limited to, changes in the following areas:  
a. Implementation procedures for internal visual and other test methods.  
b. Testing flow.  
c. Test facility (with laboratory suitability) move from one facility or building to another.  
d. Sample plans (quantity and acceptance numbers).  
e. Test procedures (including test vector generation).  
f. Lot formation.  
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