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5962-9958502QXC 参数 Datasheet PDF下载

5962-9958502QXC图片预览
型号: 5962-9958502QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 36000 Gates, 2414-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX D  
D.4.2.1 Sample size. The sample size for each subgroup shall be determined from table D-I or D-II and shall meet  
the specified sample size series. The manufacturer may, at their option, select a sample size greater than that  
required; however, the number of failures permitted shall not exceed the acceptance number associated with the  
chosen sample size in table D-I or D-II. In table D-II, the sample size series column to be used for sample size  
determination shall be that given in the lot size column which is nearest in value of the actual size of the submitted lot,  
except that if the actual lot size is midway between two of the lot sizes given in the table, either of the bounding lot  
size columns may be used at the manufacturer's option. If, in table D-II, the appropriate lot size column does not  
contain a sample size series value equal to or less than the specified sample size series value, 100 percent  
inspection shall be used. In table D-II, the sample size series value in the appropriate lot size column that is  
numerically closest to the specified sample size series value shall be used to determine the sample size.  
D.4.2.2 Acceptance procedure. For the first sampling, an acceptance number shall be chosen and the associated  
number of sample devices for the specified sample series selected and tested (see D.4.2.1). If the observed number  
of defectives from the first sample is less than or equal to the preselected acceptance number, the lot shall be  
accepted. If the observed number of defectives exceeds the preselected acceptance number, an additional sample  
may be chosen such that the total sample complies with D.4.2.3. The table (D-I or D-II), which is used for the first  
sampling of a given inspection lot for a given subgroup shall be used for any and all subsequent samplings for the  
same lot and subgroup for each lot submission.  
D.4.2.3 Additional sample. The manufacturer may add an additional quantity to the initial sample, but this may be  
done only once for any subgroup and is limited to the initial sample (e.g., does not apply to resubmitted lots after  
initial failure). The added samples shall be subjected to all the tests within the subgroup. The total sample size  
(initial and added samples) shall be determined by the new acceptance number selected from table D-I or D-II).  
D.4.2.4 Multiple criteria. When one sample is used for more than one acceptance criterion, the entire sample for a  
subgroup shall be used for all criteria within the subgroup. In table D-I, the acceptance number shall be that one  
associated with the largest sample size in the appropriate sample size series column which is less than or equal to  
the sample size used. In table D-II, the acceptance number shall be that one associated with the specified samples  
size series, in the appropriate lot size column, for the sample size used.  
D.4.2.5 One hundred percent inspection. Inspection of 100 percent of the lot shall be allowed, at the option of the  
manufacturer, for any or all subgroups other than those which are called "destructive". If the observed percent  
defective for the inspection lot exceeds the specified samples size series value, the lot shall be considered to have  
failed the appropriate subgroup(s). Resubmission of lots tested on a 100 percent inspection basis shall also be on a  
100 percent inspection basis only and in accordance with the tightened inspection sample series value and other  
requirements of A.4.3.3.1.  
D.4.2.6 Tightened inspection. Tightened inspection shall be performed by testing to the criteria of the next sample  
size series value lower than that specified in the series 1, 1.5, 2, 3, 5, and 7 times 10n, where n is an integral number.  
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