MIL-PRF-38535K
APPENDIX A
A.4.8.1.3.3 Proprietary-document identification. A listing of proprietary documents and areas shall be included in
the program plan and maintained on a current basis (see A.4.8.1).
A.4.8.1.3.4 Examples of design, material, equipment, visual standard, and process instructions. An example of
each type of design, material, equipment, visual standard, and process instruction used in the manufacture of
microcircuits intended to be submitted for acceptance inspection under this specification shall be included in the
program plan. These may be either dummies or actual working documents, but shall, in either event, show the form
of the pertinent document; blank forms shall not be included.
A.4.8.1.3.5 Examples of records. Examples of records, complying with the requirements of A.4.8.1.3.4 for
instructions, shall be included in the program plan.
A.4.8.1.3.6 Manufacturer's internal instructions for internal visual inspection. The manufacturer's internal
instructions for internal visual inspection in accordance with test method 2010 or test method 2017, as applicable, of
MIL-STD-883 for the applicable device class, shall be included in the program plan.
A.4.8.1.3.7 Examples of travelers. Wafer fab, assembly, screening, and groups A, B, C, D (and E, if applicable)
travelers shall be included in the program plan and maintained on current basis. The traveler utilized for QCI lots
may be the same traveler as used for qualification lots. When in-line inspections are allowed (e.g., alternate group A
or B) the traveler shall include documentation of required inspections. The travelers shall include all manufacturer
imposed tests. The test traveler shall include all the following minimum information (if applicable):
a. Identification as to whether the lot is qualification or QCI.
b. Name or title of operation and specification number of each process or test.
c. PIN, date code, and manufacturer internal lot identification number(s).
d. Date(s) of test and operator identification.
e. Calibration control number or equipment identification of all major equipment components used for test.
f. Quantity tested and rejected for each process or test and actual quantity tested, if sampled.
g. Serial numbers of passing and failing devices when applicable.
h. Time in and out of process or test if critical to process or test results (e.g., burn-in and 96-hour window).
i. Specific major conditions of tests that is verifiable by operator including times, temperatures, RPMs, etc.
(Not required for screening and QCI traveler.)
j. The percent defective calculated for burn-in.
k. Burn-in/life test board serial number or test circuit identification number and revision.
l. All required variables data except for electrical tests (attachments permitted). (Not required for QCI
traveler.)
m. For electrical tests, test program number and revision and identify when variables data is required.
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ACTEL [ Actel Corporation ]
