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5962-0422104QUC 参数 Datasheet PDF下载

5962-0422104QUC图片预览
型号: 5962-0422104QUC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 2000000 Gates, 32256-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX F  
F.4.7.4.1 Highly accelerated stress testing (HAST). HAST shall be performed in accordance with J-STD-020, and  
shall be performed using a sample size number (accept number) of 15(0) for 50 hours at +130°C at 85 percent  
relative humidity and a voltage bias applied. As an option, 85/85 testing in accordance with JESD22-A101 shall be  
performed using 15(0) sample size (accept number) for 1,000 hours.  
F.4.7.4.2 Post-test visual examinations. Post-test visual examinations shall be performed in accordance with  
F.4.6.6 of this appendix.  
F.4.8 Major changes. Major changes shall be as set forth in MIL-PRF-38535 as applicable. In addition, the  
following shall be considered as a major change:  
a. Any change to baselined items in this appendix.  
b. Bond characterization parameters.  
L > W  
FIGURE F-1. Lead contact length.  
136  
 
 
 
 
 
 
 
 
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