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5962-0151801QYC 参数 Datasheet PDF下载

5962-0151801QYC图片预览
型号: 5962-0151801QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 32000 Gates, 206MHz, 2880-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX B  
SPACE APPLICATION  
B.1 SCOPE  
B.1.1 Scope. This appendix presents the requirements that are to be used to supplement this specification and the other  
applicable appendices for space level microcircuits. The manufacturer's process may include innovative and improved processes  
that result in an equivalent or higher quality product, provided that the process used to evaluate and document these changes has  
been reviewed and approved by the qualifying activity after coordination with the government space community (e.g., DTRA, NASA,  
NRO, and AFSMC). The approach outlined in this appendix is a proven baseline that contains details of the screening and  
technology conformance inspection (TCI) procedures. Manufacturers are to be able to demonstrate a process control system that  
achieves at least the same level of quality as could be achieved by complying with this appendix. This appendix is intended for  
product to be used in space applications. This appendix is a mandatory part of the specification. The information contained herein is  
intended for compliance.  
B.2 APPLICABLE DOCUMENTS.  
B.2.1 General. The documents listed in this section are specified in sections B.3 or B.4 of this appendix. This section does not  
include documents cited in other sections of this appendix or recommended for additional information or as examples. While every  
effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified  
requirements of documents cited in sections B.3 and B.4 of this appendix, whether or not they are listed.  
B.2.2 Government documents.  
B.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this  
document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation  
or contract.  
DEPARTMENT OF DEFENSE SPECIFICATIONS  
MIL-M-38510  
- Microcircuits, General Specification For.  
DEPARTMENT OF DEFENSE STANDARDS  
MIL-STD-883  
- Test Method Standard Microcircuits.  
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order Desk,  
700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
B.2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless  
otherwise specified, the issues of these documents are those cited in the solicitation or contract.  
ASTM INTERNATIONAL (ASTM)  
ASTM F1192  
- Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion  
Irradiation of Semiconductor Devices.  
(Copies of these documents are available online at http://www.astm.org/ or from ASTM International, 100 Barr Harbor  
Drive, P.O. Box C700, West Conshohocken, PA 19428-2959.)  
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