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5962-0151502QXC 参数 Datasheet PDF下载

5962-0151502QXC图片预览
型号: 5962-0151502QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 72000 Gates, 139MHz, 6036-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 时钟可编程逻辑
文件页数/大小: 21 页 / 171 K
品牌: ACTEL [ Actel Corporation ]
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TABLE I. Electrical performance characteristics – Continued.  
1/ 2/  
10/ Absolute maximum pin capacitance for a PCI input is 10 pF. Exceptions will be for clock pins including CLK A/B, HCLK,  
QCLK A/B/C/D.  
11/ This parameter (I ) is not directly tested but fully characterized (see 2/). It is the minimum voltage to which pull-up  
IPU  
resistors are calculated to pull a floated network. Applications sensitive to static power utilization should assure that the  
input buffer is conducting minimum current at this input voltage.  
TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/ 5/ 6/ 7/ 8/  
Line  
no.  
Test requirements  
Subgroups  
(in accordance with  
MIL-STD-883,  
Subgroups  
(in accordance with  
MIL-PRF-38535, table III)  
TM 5005, table I)  
Device  
class M  
Device  
class Q  
Device  
class V  
1
2
Interim electrical  
parameters (see 4.2)  
1, 7, 9  
Static burn-in  
Not  
Not  
Required  
(method 1015)  
required  
required  
3
4
Same as line 1  
1*, 7* ∆  
Dynamic burn-in  
(method 1015)  
Required  
Required  
Required  
5
6
Same as line 1  
1*, 7* ∆  
Final electrical  
parameters (see 4.2)  
1*, 2, 3, 7*, 8A,  
8B, 9, 10, 11  
1*, 2, 3, 7*, 8A,  
8B, 9, 10, 11  
1*, 2, 3, 7*, 8A,  
8B, 9, 10, 11  
7
8
Group A test  
requirements (see 4.4)  
1, 2, 3, 4**, 7,  
8A, 8B, 9, 10, 11  
1, 2, 3, 4**, 7,  
8A, 8B, 9, 10, 11  
1, 2, 3, 4**, 7,  
8A, 8B, 9, 10, 11  
Group C end-point  
electrical parameters  
(see 4.4)  
2, 3, 7,  
8A, 8B  
2, 3, 7,  
8A, 8B  
1, 2, 3, 7, 8A,  
8B, 9, 10, 11 ∆  
9
Group D end-point  
electrical parameters  
(see 4.4)  
2, 3, 8A, 8B  
1, 7, 9  
2, 3, 8A, 8B  
1, 7, 9  
2, 3, 8A, 8B  
1, 7, 9  
10  
Group E end-point  
electrical parameters  
(see 4.4)  
1/ Blank spaces indicate tests are not applicable.  
2/ Any or all subgroups may be combined when using high-speed testers.  
3/ Subgroups 7 and 8 functional tests shall verify the functionality for unprogrammed devices or that the altered item  
drawing pattern exists for programmed devices.  
4/ * indicates PDA applies to subgroup 1 and 7.  
5/ ** see 4.4.1c.  
6/ indicates delta limit (see table IIB) shall be required where specified, and the delta values shall be computed  
with reference to the previous interim electrical parameters (see line 1).  
7/ See 4.4.1d.  
8/ Subgroups 9,10, and 11 switching parameters, if not provided in table I, shall be designated by device  
manufacturer's TRB in accordance with MIL-PRF-38535 and shall be maintained under document revision level  
control, and shall be made available to the acquiring or preparing activity upon request.  
SIZE  
STANDARD  
5962-01515  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43218-3990  
REVISION LEVEL  
E
SHEET  
12  
DSCC FORM 2234  
APR 97