ACE605
Ultra Low Dropout 2A CMOS LDO
Note:
1. Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for stress
ratings. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections
of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may remain
possibility to affect device reliability.
2. Devices are ESD sensitive. Handling precaution recommended.
3. The device is not guaranteed to function outside its operating conditions.
4. The dropout voltage is defined as VIN -VOUT, which is measured when VOUT is VOUT NORMAL) − 100mV.
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5. Regulation is measured at constant junction temperature by using a 20ms current pulse. Devices are tested for load regulation
in the load range from 10mA to 2A.
6. Quiescent, or ground current, is the difference between input and output currents. It is defined by IQ = IIN – IOUT under no load
condition (IOUT = 0mA). The total current drawn from the supply is the sum of the load current plus the ground pin current.
7. Try to layout the pads larger to get better heat-sink , result in larger current output.
Application of ACE6052XFM+ and ACE6054XFM+
ACE6052XFM+
ACE6052XFM+
VER 1.3
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