CF5072 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 4
Parameters: I , Duty1, Duty2, V , t , t
r
Parameter: I
IL
DD
Opp
f
IDD
A
VDD1
VDD2
VSS2
VDD1
XIN
VDD2
RP
LS
OE
50Ω
50Ω
OUTN
XC
XR
VC
A
IIL
VSS1
OUT
VDD−2V
VSS1
VSS2
Measurement Circuit 5
Parameter: Z
IN
Measurement Circuit 2
Parameters: V , V
OH OL
VDD1
VDD2
VSS2
I1
VC
A
VDD1
XIN
VDD2
OUTN
1kΩ
50Ω
50Ω
ZIN = VDD/I1
VSS1
TEST
VSS1
OUT
VSS2
VDD−2V
V
V
Measurement Circuit 6
VOH,VOL
Parameter: R
VC
When XIN = HIGH: OUT is tied LOW (V
OL
OUTN is tied HIGH (V
When XOUT = LOW: OUT is tied HIGH (V
)
)
OH
)
OH
OUTN is tied LOW (V
)
VDD1
VDD2
VSS2
OL
I2
VC
A
Measurement Circuit 3
Parameters: V , V , t , t
IH IL OE OD
XR
V2
V
VSS1
RVC = V2/I2
VDD1
XIN
VDD2
RP
LS
50Ω
50Ω
OUTN
XC
XR
OE
Measurement Circuit 7
OUT
Parameter: R
S
VDD−2V
VSS1
VSS2
V
VDD1
VDD2
VSS2
VIH,VIL
I3
XC
A
V
: output state changes V → V
SS
IH
DD
SS
V : output state changes V → V
IL
OE: disable function
DD
V3
V
VSS1
RS = V3/I3
NIPPON PRECISION CIRCUITS INC.—6
SEIKO [ SEIKO EPSON CORPORATION ]
