欢迎访问ic37.com |
会员登录 免费注册
发布采购

1203P60 参数 Datasheet PDF下载

1203P60图片预览
型号: 1203P60
PDF下载: 下载PDF文件 查看货源
内容描述: PWM电流模式控制器的通用离线用品配备备用和短路 [PWM Current-Mode Controller for Universal Off-Line Supplies Featuring Standby and Short Circuit]
分类和应用: 控制器
文件页数/大小: 14 页 / 148 K
品牌: ONSEMI [ ONSEMI ]
 浏览型号1203P60的Datasheet PDF文件第1页浏览型号1203P60的Datasheet PDF文件第2页浏览型号1203P60的Datasheet PDF文件第4页浏览型号1203P60的Datasheet PDF文件第5页浏览型号1203P60的Datasheet PDF文件第6页浏览型号1203P60的Datasheet PDF文件第7页浏览型号1203P60的Datasheet PDF文件第8页浏览型号1203P60的Datasheet PDF文件第9页  
NCP1203  
Adj  
1
HV  
8
HV CURRENT  
SOURCE  
SKIP CYCLE  
COMPARATOR  
80 k  
1.2 V  
24 k  
NC  
7
FB  
2
+
UVLO HIGH AND LOW  
INTERNAL REGULATOR  
INTERNAL V  
CC  
CURRENT  
SENSE  
Q FLIP−FLOP  
DCmax = 80%  
V
6
CC  
SET  
Q
250 ns  
L.E.B.  
40−60−100 kHz  
CLOCK  
OVERLOAD  
MANAGEMENT  
3
RESET  
+
20 k  
57 k  
Drv  
5
GROUND  
4
V
REF  
+
25 k  
±250 mA  
1 V  
Figure 2. Internal Circuit Architecture  
MAXIMUM RATINGS  
Rating  
Symbol  
, Drv  
Value  
16  
Unit  
Power Supply Voltage  
V
V
V
CC  
Power Supply Voltage on all other pins except Pin 5 (Drv), Pin 6 (V ) and Pin 8 (HV)  
−0.3 to 10  
5.0  
CC  
Maximum Current into all pins except Pin 6 (V ) and Pin 8 (HV) when  
mA  
CC  
10 V ESD diodes are activated  
Thermal Resistance Junction−to−Air, PDIP−8 Version  
Thermal Resistance Junction−to−Air, SOIC Version  
R
R
100  
178  
°C/W  
°C/W  
q
q
JA  
JA  
Maximum Junction Temperature  
Temperature Shutdown  
TJ  
150  
170  
°C  
°C  
°C  
°C  
KV  
V
MAX  
Hysteresis in Shutdown  
30  
Storage Temperature Range  
−60 to +150  
2.0  
ESD Capability, HBM Model, All pins except Pin 6 (V ) and Pin 8 (HV)  
CC  
ESD Capability, Machine Model  
200  
Maximum Voltage on Pin 6 (V ) and Pin 8 (HV) Decoupled to Ground with 10 mF  
450  
V
CC  
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit  
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,  
damage may occur and reliability may be affected.  
http://onsemi.com  
3