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M14D5121632A-2.5BIG2H 参数 Datasheet PDF下载

M14D5121632A-2.5BIG2H图片预览
型号: M14D5121632A-2.5BIG2H
PDF下载: 下载PDF文件 查看货源
内容描述: [DDR DRAM, 32MX16, 0.4ns, CMOS, PBGA84, 8 X 12.50 MM, 1.20 MM HEIGHT, 0.80 MM PITCH, LEAD FREE, BGA-84]
分类和应用: 动态存储器双倍数据速率内存集成电路
文件页数/大小: 62 页 / 1001 K
品牌: ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
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ESMT  
M14D5121632A (2H)  
Operation Temperature Condition (TC) -40°C~95°C  
Pin Description  
Pin Name  
Function  
Pin Name  
Function  
Address inputs  
- Row address A0~A12  
DM is an input mask signal for write data.  
LDM is DM for DQ0~DQ7 and UDM is DM  
for DQ8~DQ15.  
A0~A12,  
BA0,BA1  
DM  
- Column address A0~A9  
A10/AP : Auto Precharge  
BA0, BA1 : Bank selects (4 Banks)  
(LDM, UDM)  
DQ0~DQ15  
Data-in/Data-out  
Differential clock input  
CLK, CLK  
CKE  
Command input  
Command input  
Command input  
Ground  
Clock enable  
RAS  
CAS  
Chip select  
CS  
VDDQ  
VSSQ  
VREF  
Supply Voltage for DQ  
Ground for DQ  
Reference Voltage  
WE  
VSS  
VDD  
Power  
DQS, DQS  
Bi-directional differential Data Strobe.  
VDDL  
Supply Voltage for DLL  
Ground for DLL  
LDQS and LDQS are DQS for DQ0~DQ7;  
UDQS and LDQS are DQS for DQ8~DQ15.  
(LDQS, LDQS  
UDQS, UDQS )  
On-Die-Termination.  
ODT is only applied to DQ0~DQ15, DM,  
DQS and DQS .  
ODT  
NC  
VSSDL  
No connection  
Absolute Maximum Rating  
Parameter  
Voltage on any pin relative to VSS  
Voltage on VDD supply relative to VSS  
Voltage on VDDL supply relative to VSS  
Voltage on VDDQ supply relative to VSS  
Storage temperature  
Symbol  
Value  
Unit  
VIN, VOUT  
VDD  
-0.5 ~ 2.3  
-1.0 ~ 2.3  
-0.5 ~ 2.3  
-0.5 ~ 2.3  
-55 ~ +100  
V
V
VDDL  
V
VDDQ  
TSTG  
V
°C ( Note *)  
Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect  
reliability.  
Note *: Storage Temperature is the case surface temperature on the center/top side of the DRAM.  
Elite Semiconductor Memory Technology Inc.  
Publication Date : Aug. 2011  
Revision : 1.1 4/62