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M13S5121632A 参数 Datasheet PDF下载

M13S5121632A图片预览
型号: M13S5121632A
PDF下载: 下载PDF文件 查看货源
内容描述: 8M ×16位×4银行双倍数据速率SDRAM [8M x 16 Bit x 4 Banks Double Data Rate SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 47 页 / 966 K
品牌: ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
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ESMT  
M13S5121632A  
AC Timing Parameter & Specifications-continued  
-5  
Parameter  
Symbol  
Unit  
Note  
min  
max  
Half Clock Period  
tHP  
tQH  
tCLmin or tCHmin  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
DQ-DQS output hold time  
Data hold skew factor  
t
HP-tQHS  
-
-
tQHS  
tRAS  
tRC  
0.5  
ACTIVE to PRECHARGE command  
Row Cycle Time  
40  
70K  
55  
-
-
-
-
AUTO REFRESH Row Cycle Time  
ACTIVE to READ,WRITE delay  
PRECHARGE command period  
tRFC  
tRCD  
tRP  
70  
15  
15  
ACTIVE bank A to ACTIVE bank B  
command  
tRRD  
10  
-
ns  
Write recovery time  
tWR  
tWTR  
15  
2
-
ns  
tCK  
us  
Write data in to READ command delay  
Average periodic refresh interval  
Write preamble  
-
tREFI  
-
7.8  
-
4
3
2
tWPRE  
tWPST  
tRPRE  
tRPST  
0.25  
0.4  
0.9  
0.4  
tCK  
tCK  
tCK  
tCK  
Write postamble  
0.6  
1.1  
0.6  
DQS read preamble  
DQS read postamble  
Clock to DQS write preamble setup  
time  
tWPRES  
0
-
ns  
Load Mode Register / Extended Mode  
register cycle time  
tMRD  
tXSRD  
tXSNR  
10  
200  
75  
-
-
-
ns  
tCK  
ns  
Exit self refresh to READ command  
Exit self refresh to non-READ  
command  
Autoprecharge write  
recovery+Precharge time  
tDAL  
30  
-
ns  
Note :  
1. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referenced  
to a specific voltage level, but specify when the device output is no longer driving (HZ), or begins driving (LZ).  
2. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but  
system performance (bus turnaround) will degrade accordingly.  
3. The specific requirement is that DQS be valid (HIGH, LOW, or at some point on a valid transition) on or before this CLK edge.  
A valid transition is defined as monotonic, and meeting the input slew rate specifications of the device. When no writes were  
previously in progress on the bus, DQS will be transitioning from High-Z to logic LOW. If a previous write was in progress,  
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS  
.
4. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device.  
5. For command/address and CLK & CLK slew rate > 1.0V/ns.  
Elite Semiconductor Memory Technology Inc.  
Publication Date : Oct. 2008  
Revision : 1.0 7/47