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E1922E20 参数 Datasheet PDF下载

E1922E20图片预览
型号: E1922E20
PDF下载: 下载PDF文件 查看货源
内容描述: 4G位DDR3L SDRAM [4G bits DDR3L SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 29 页 / 426 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EDJ4204EFBG, EDJ4208EFBG, EDJ4216EFBG  
1.4 IDD and IDDQ Measurement Conditions  
In this chapter, IDD and IDDQ measurement conditions such as test load and patterns are defined.  
The figure Measurement Setup and Test Load for IDD and IDDQ Measurements shows the setup and test load for IDD  
and IDDQ measurements.  
• IDD currents (such as IDD0, IDD1, IDD2N, IDD2NT, IDD2P0, IDD2P1, IDD2Q, IDD3N, IDD3P, IDD4R, IDD4W,  
IDD5B, IDD6, IDD6ET, IDD6TC and IDD7) are measured as time-averaged currents with all VDD balls of the DDR3  
SDRAM under test tied together. Any IDDQ current is not included in IDD currents.  
• IDDQ currents (such as IDDQ2NT and IDDQ4R) are measured as time-averaged currents with all VDDQ balls of  
the DDR3 SDRAM under test tied together. Any IDD current is not included in IDDQ currents.  
Note:IDDQ values cannot be directly used to calculate I/O power of the DDR3 SDRAM. They can be used to support  
correlation of simulated I/O power to actual I/O power as outlined in correlation from simulated channel I/O  
power to actual channel I/O power supported by IDDQ measurement.  
For IDD and IDDQ measurements, the following definitions apply:  
• L and 0: VIN VIL(AC)max  
• H and 1: VIN VIH(AC)min  
• MID-LEVEL: defined as inputs are VREF = VDDQ / 2  
• FLOATING: don't care or floating around VREF.  
• Timings used for IDD and IDDQ measurement-loop patterns are provided in Timings used for IDD and IDDQ  
Measurement-Loop Patterns table.  
• Basic IDD and IDDQ measurement conditions are described in Basic IDD and IDDQ Measurement Conditions  
table.  
Note:The IDD and IDDQ measurement-loop patterns need to be executed at least one time before actual IDD or  
IDDQ measurement is started.  
• Detailed IDD and IDDQ measurement-loop patterns are described in IDD0 Measurement-Loop Pattern table  
through IDD7 Measurement-Loop Pattern table.  
• IDD Measurements are done after properly initializing the DDR3 SDRAM. This includes but is not limited to setting.  
RON = RZQ/7 (34Ω in MR1);  
Qoff = 0B (Output Buffer enabled in MR1);  
RTT_Nom = RZQ/6 (40Ω in MR1);  
RTT_WR = RZQ/2 (120Ω in MR2);  
TDQS Feature disabled in MR1  
• Define D = {/CS, /RAS, /CAS, /WE} : = {H, L, L, L}  
• Define /D = {/CS, /RAS, /CAS, /WE} : = {H, H, H, H}  
Data Sheet E1922E20 (Ver. 2.0)  
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