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CES2324 参数 Datasheet PDF下载

CES2324图片预览
型号: CES2324
PDF下载: 下载PDF文件 查看货源
内容描述: N沟道增强型网络场效晶体管 [N-Channel Enhancement Mode Field Effect Transistor]
分类和应用: 晶体晶体管
文件页数/大小: 4 页 / 293 K
品牌: CET [ CHINO-EXCEL TECHNOLOGY ]
 浏览型号CES2324的Datasheet PDF文件第1页浏览型号CES2324的Datasheet PDF文件第3页浏览型号CES2324的Datasheet PDF文件第4页  
CES2324  
Electrical Characteristics TA = 25 C unless otherwise noted  
Parameter  
Off Characteristics  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate Body Leakage Current, Forward  
Gate Body Leakage Current, Reverse  
On Characteristics c  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
VDS = 16V, VGS = 0V  
VGS = 12V, VDS = 0V  
VGS = -12V, VDS = 0V  
20  
V
1
µA  
nA  
nA  
IGSSF  
IGSSR  
100  
-100  
Gate Threshold Voltage  
Static Drain-Source  
VGS(th)  
RDS(on)  
gFS  
VGS = VDS, ID = 250µA  
VGS = 4.5V, ID = 4.2A  
VGS = 2.5V, ID = 3.6A  
VDS = 10V, ID = 4.0A  
0.5  
1.5  
45  
80  
V
35  
50  
8
m  
mΩ  
S
7
On-Resistance  
Forward Transconductance  
Dynamic Characteristics d  
Input Capacitance  
Ciss  
Coss  
Crss  
500  
300  
140  
pF  
pF  
pF  
VDS = 8V, VGS = 0V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics d  
Turn-On Delay Time  
td(on)  
tr  
td(off)  
tf  
20  
18  
60  
28  
10  
2.3  
2.9  
40  
40  
ns  
ns  
VDD = 10V, ID = 1A,  
VGS = 4.5V, RGEN = 6Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
108  
56  
ns  
Turn-Off Fall Time  
ns  
Total Gate Charge  
Qg  
15  
nC  
nC  
nC  
VDS = 10V, ID = 4.2A,  
VGS = 4.5V  
Gate-Source Charge  
Qgs  
Qgd  
Gate-Drain Charge  
Drain-Source Diode Characteristics and Maximun Ratings  
Drain-Source Diode Forward Current b  
Drain-Source Diode Forward Voltage c  
IS  
1.3  
1.2  
A
V
VSD  
VGS = 0V, IS = 1.3A  
Notes :  
a.Repetitive Rating : Pulse width limited by maximum junction temperature.  
b.Surface Mounted on FR4 Board, t < 10 sec.  
c.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2%.  
d.Guaranteed by design, not subject to production testing.  
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