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BS616LV2013AC 参数 Datasheet PDF下载

BS616LV2013AC图片预览
型号: BS616LV2013AC
PDF下载: 下载PDF文件 查看货源
内容描述: 非常低的功率/电压CMOS SRAM 128K ×16位 [Very Low Power/Voltage CMOS SRAM 128K X 16 bit]
分类和应用: 静态存储器
文件页数/大小: 11 页 / 242 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
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BS616LV2013  
BSI  
„ ABSOLUTE MAXIMUM RATINGS(1)  
„ OPERATING RANGE  
AMBIENT  
SYMBOL  
PARAMETER  
RATING  
UNITS  
RANGE  
Vcc  
TEMPERATURE  
Terminal Voltage with  
-0.5 to  
V
TERM  
BIAS  
STG  
T
V
T
T
P
Respect to GND  
Vcc+0.5  
Commercial  
Industrial  
0 O C to +70O  
-40 O C to +85O  
C
2.4V ~ 3.6V  
2.4V ~ 3.6V  
Temperature Under Bias  
Storage Temperature  
Power Dissipation  
-40 to +125  
-60 to +150  
1.0  
O C  
O C  
W
C
„ CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz)  
DC Output Current  
20  
mA  
OUT  
I
SYMBOL  
PARAMETER  
CONDITIONS  
MAX. UNIT  
Input  
IN  
C
IN  
V
=0V  
6
8
pF  
pF  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM  
RATINGS may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
reliability.  
Capacitance  
Input/Output  
Capacitance  
CDQ  
VI/O=0V  
1. This parameter is guaranteed and not tested.  
„ DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC )  
PARAMETER  
(1)  
UNITS  
PARAMETER  
TEST CONDITIONS  
MIN. TYP.  
MAX.  
NAME  
Guaranteed Input Low  
Vcc=3.0V  
Vcc=3.0V  
VIL  
-0.5  
--  
0.8  
V
Voltage(2)  
Guaranteed Input High  
Voltage(2)  
VIH  
IIL  
2.0  
--  
--  
--  
Vcc+0.2  
1
V
Input Leakage Current  
Vcc = Max, VIN = 0V to Vcc  
Vcc = Max, CE = VIH, or OE = VIH  
uA  
,
IOL  
Output Leakage Current  
--  
--  
1
uA  
V
I/O = 0V to Vcc  
Vcc=3.0V  
Vcc=3.0V  
VOL  
VOH  
Output Low Voltage  
Output High Voltage  
Vcc = Max, IOL = 2mA  
Vcc = Min, IOH = -1mA  
--  
--  
--  
0.4  
--  
V
V
2.4  
Operating Power Supply  
Current  
Vcc=3.0V  
Vcc=3.0V  
Vcc=3.0V  
ICC  
CE = VIL, IDQ = 0mA, F = Fmax(3)  
--  
--  
--  
--  
--  
20  
1
mA  
mA  
uA  
ICCSB  
Standby Current-TTL  
CE = VIH, IDQ = 0mA  
CE Њ Vcc-0.2V,  
ICCSB1  
Standby Current-CMOS  
0.1  
0.7  
V
IN Њ Vcc - 0.2V or VIN Љ 0.2V  
o
1. Typical characteristics are at TA = 25 C.  
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.  
3. Fmax = 1/tRC  
.
„ DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70oC )  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
MIN.  
TYP.(1)  
MAX.  
UNITS  
CE Њ Vcc - 0.2V  
VIN Њ Vcc - 0.2V or VIN Љ 0.2V  
VDR  
Vcc for Data Retention  
1.5  
--  
--  
V
CE Њ Vcc - 0.2V  
ICCDR  
Data Retention Current  
--  
0
0.05  
0.5  
uA  
VIN Њ Vcc - 0.2V or VIN Љ 0.2V  
Chip Deselect to Data  
Retention Time  
Operation Recovery Time  
tCDR  
tR  
--  
--  
--  
--  
ns  
ns  
See Retention Waveform  
(2)  
TRC  
O
1. Vcc = 1.5V, TA = + 25 C  
2. tRC = Read Cycle Time  
Revision 2.5  
April 2002  
R0201-BS616LV2013  
3