BH62UV4000
n PIN DESCRIPTIONS
Name
Function
These 19 address inputs select one of the 524,288 x 8 bit in the RAM
A0-A18 Address Input
CE is active LOW. Chip enable must be active when data read from or write to the
device. If chip enable is not active, the device is deselected and is in standby power
mode. The DQ pins will be in the high impedance state when the device is deselected.
The write enable input is active LOW and controls read and write operations. With the
chip selected, when WE is HIGH and OE is LOW, output data will be present on the
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the
selected memory location.
CE Chip Enable 1 Input
WE Write Enable Input
OE Output Enable Input
The output enable input is active LOW. If the output enable is active while the chip is
selected and the write enable is inactive, data will be present on the DQ pins and they
will be enabled. The DQ pins will be in the high impendence state when OE is inactive.
8 bi-directional ports are used to read data from or write data into the RAM.
DQ0-DQ7 Data Input/Output
Ports
VCC
Power Supply
Ground
VSS
n TRUTH TABLE
MODE
I/O OPERATION
VCC CURRENT
CE
WE
OE
Chip De-selected
(Power Down)
H
X
X
High Z
ICCSB, ICCSB1
Output Disabled
Read
L
L
L
H
H
L
H
L
High Z
DOUT
DIN
ICC
ICC
ICC
Write
X
NOTES: H means VIH; L means VIL; X means don’t care (Must be VIH or VIL state)
n ABSOLUTE MAXIMUM RATINGS (1)
n OPERATING RANGE
AMBIENT
TEMPERATURE
-40OC to + 85OC
SYMBOL
PARAMETER
RATING
UNITS
RANG
VCC
Terminal Voltage with
Respect to GND
VTERM
-0.5(2) to 4.6V
V
Industrial
1.65V ~ 3.6V
Temperature Under
Bias
TBIAS
TSTG
PT
-40 to +125
-60 to +150
1.0
OC
OC
W
n CAPACITANCE (1) (TA = 25OC, f = 1.0MHz)
Storage Temperature
Power Dissipation
DC Output Current
SYMBOL PAMAMETER CONDITIONS MAX. UNITS
IOUT
20
mA
Input
Capacitance
CIN
CIO
VIN = 0V
VI/O = 0V
6
8
pF
pF
1. Stresses greater than those listed under ABSOLUTE
MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
Input/Output
Capacitance
1. This parameter is guaranteed and not 100% tested.
2. –2.0V in case of AC pulse width less than 30 ns
Revision 1.2
Aug. 2006
R0201-BH62UV4000
2
BSI [ BRILLIANCE SEMICONDUCTOR ]
