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JANTX2N4399 参数 Datasheet PDF下载

JANTX2N4399图片预览
型号: JANTX2N4399
PDF下载: 下载PDF文件 查看货源
内容描述: 晶体管| BJT | PNP | 60V V( BR ) CEO | 30A I(C ) | TO- 3\n [TRANSISTOR | BJT | PNP | 60V V(BR)CEO | 30A I(C) | TO-3 ]
分类和应用: 晶体晶体管开关局域网
文件页数/大小: 16 页 / 85 K
品牌: ETC [ ETC ]
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MIL-PRF-19500/433E
4. VERIFICATION
4.1 Classification of and inspection. The inspection requirements specified herein are classified as follows:
a.
b.
c.
Qualification inspection (see 4.2).
Screening (see 4.3).
Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500 (appendix E, table
IV), and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits
of table I herein shall not be acceptable.
Screen (see table IV
of MIL-PRF-19500)
JANS level
1/
9
Thermal response (see 4.3.2)
I
CEX1
and h
FE2
Measurement
JANTX and JANTXV levels
Thermal response (see 4.3.2)
I
CEX1
11
I
CEX1
and h
FE2
∆I
CEX1
100 percent of initial value
or 5 nA dc, whichever is greater.
∆h
FE2
± 15 percent of initial value
I
CEX1
and h
FE2
;
∆I
CEX1
100 percent of initial value
or 100 nA dc, whichever is greater.
12
See 4.3.1
See 4.3.1
13
Subgroup 2 of table I herein;
∆I
CEX1
100 percent of initial value
or 50 nA dc, whichever is greater;
∆h
FE2
± 15 percent of initial value
Subgroup 2 of table I herein;
∆I
CEX1
100 percent of initial value
or 100 nA dc, whichever is greater;
∆h
FE2
± 15 percent of initial value;
1/ This test shall be performed anytime after screen 3.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
TJ = 187.5
±
12.5°C; VCE = 25 V dc; TA = room ambient as defined in the general requirements of MIL-STD-750.
4.3.2 Thermal response (∆VBE measurements). The∆VBE measurements shall be performed in accordance with
MIL-STD-750., method 3131. The
∆V
BE conditions (IH and VH) and maximum limit shall be derived by each vendor. The chosen
∆V
BE measurement and conditions for each device in the qualification lot shall be submitted in the qualification report and a thermal
response curve shall be plotted. The chosen
∆V
BE shall be considered final after the manufacturer has had the opportunity to test five
consecutive lots. One hundred percent Safe Operating Area (SOA) testing may be performed in lieu of thermal response testing herein
provided that the appropriate conditions of temperature, time, current, and voltage to achieve die attach integrity are submitted to the
qualifying activity.
5