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MT88V32AP1 参数 Datasheet PDF下载

MT88V32AP1图片预览
型号: MT88V32AP1
PDF下载: 下载PDF文件 查看货源
内容描述: [Cross Point Switch, 1 Func, 8 Channel, CMOS, PQCC44, LEAD FREE, PLASTIC, MS-018AC, LCC-44]
分类和应用:
文件页数/大小: 19 页 / 317 K
品牌: ZARLINK [ ZARLINK SEMICONDUCTOR INC ]
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MT88V32  
Data Sheet  
AC Electrical Characteristics- Crosspoint Performance- Voltages are with respect to VDD=+5V, VDC=0, VEE=-7V, VSS=0V,  
unlesss otherwise stated. Also applicable for VEE=VSS=0, VDD=+12V, VDC=(VDD+VEE)/2.  
Characteristics  
Sym. Min. Typ.Max.  
Units  
Test Conditions  
1 Xi to 1 Yi  
1
2
3
4
5
6
On-state Xi capacitance1  
On-state Yi capacitance2  
Off-state Xi capacitance2  
Off-state Yi capacitance2  
Break-before-Make interval  
CXi (on)  
CYi (on)  
CXi (off)  
CYi (off)  
topen  
56  
56  
30  
15  
pF  
pF  
pF  
pF  
ns  
1 Yi to 1 Xi  
10  
Single channel feedthrough  
(all crosspoints open)  
(see Fig. 8)  
FDT  
RS= RL=75Ω  
VIN=0.6Vpp @ 5MHz  
VIN=0.6Vpp @ 15MHz  
-80  
-62  
dB  
dB  
7
Single channel feedthrough  
(all crosspoints closed)  
(See Fig. 9)  
Xtalk  
(sc)  
RIN= 10Ω, RL= 10kΩ  
VIN=0.6Vpp @ 5MHz  
VIN=0.6Vpp @ 15MHz  
-85  
-68  
dB  
dB  
Xtalk  
(sc)  
RIN= 75Ω, RL= 10kΩ  
VIN=0.6Vpp @ 5MHz  
VIN=0.6Vpp @ 15MHz  
-70  
-50  
dB  
dB  
8
9
All channel crosstalk  
(all crosspoints closed)  
(See Fig. 10)  
Xtalk  
(ac)  
-55  
dB  
RIN= 10Ω, RL= 10kΩ  
VIN=0.6Vpp @ 5MHz  
Frequency Response  
(see Fig.11)  
f3dB  
DP  
200  
0.05  
0.11  
MHz RS= RL=50Ω  
o
10 Differential Phase Error  
See Note 1, RS= 50Ω,  
RL= 75Ω  
See Note 1, RS= 50Ω,  
RL= 75Ω  
11 Differential Gain Error  
DG  
%
† Timing is over recommended temperature range.  
‡ Typical figures are at 25°C and are for design aid only; not guaranteed and not subject to production testing.  
Notes:  
1 Valid for VEE=-7V, VDD=+5V and VDC=-2.0V. Error will increase slightly if input is biased differently.  
Input test signal: 700mV ramp biased @ -2.0 Vdc with a superimposed video signal of 285Vrms @ 3.58 MHz.  
2 Guaranteed by design and characterization and not subject to production testing.  
15  
Zarlink Semiconductor Inc.  
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