MA828
ELECTRICAL CHARACTERISTICS
These characteristics are guaranteed over the following conditions (unless otherwise stated):
VDD = 15V65%, TAMB = 125°C
DC Characteristics
Value
Characteristic
Symbol
Units
Conditions
Min. Typ. Max.
Input high voltage
VIH
VIL
2
V
V
Input low voltage
0·8
Input leakage current
Output high voltage
Output low voltage
Supply current (static)
Supply current (dynamic)
Supply voltage
IIN
10
µA
V
VIN = VSS or VDD
IOH = 24mA
IOL = 4mA
VOH
4·0 .4·5
,0·2 0·4
100
VOL
V
IDD (static)
IDD (dynamic)
VDD
µA
mA
V
All outputs open circuit
fCLK = 10MHz
,10 20
4·75 5·0
7·5
AC Characteristics
Characteristic
Value
Symbol
Units
Conditions
Min. Typ. Max.
Clock frequency
fCLK
12·5
2/fCLK 3/fCLK
2/fCLK 3/fCLK
MHz
µs
M : S ratio = 1 : 1 620%
fCLK in MHz
SET TRIP = 0 → outputs tripped
→TRIP = 0
tTRIP
µs
fCLK in MHz
NOTE 1. For microprocessor interface timings, see Intel and Motorola bus timings (Tables 1 and 2).
ABSOLUTE MAXIMUM RATINGS
Supply voltage, VDD
10V
SS20·3V to VDD10·3V
610mA
Voltage on any pin
V
Current through any I/O pin
Storage temperature
Operating temperature range
Stresses above those listed in the Absolute Maximum Rat-
ings may cause permanent damage to the device. These are
stressratingsonlyandfunctionaloperationofthedeviceatthese
conditions, oratanyotherconditionabovethoseindicatedinthe
operations section of this specification, is not implied. Exposure
to Absolute Maximum Rating conditions for extended periods
may affect device reliability.
265°C to 1125°C
0°C to 170°C
The temperature ranges quoted apply to all package types.
Many package types are available and extended temperature
ranges can be offered for some. Further information is available
on request.
11
ZARLINK [ ZARLINK SEMICONDUCTOR INC ]
