QPro Virtex 2.5V QML High-Reliability FPGAs
Table 1:
QPro Virtex Field-Programmable Gate Array Family Members
Device
XQV100
XQV300
XQV600
XQV1000
System Gates
108,904
322,970
661,111
1,124,022
CLB Array
20 x 30
32 x 48
48 x 72
64 x 96
Logic Cells
2,700
6,912
15,552
27,648
Maximum
Available I/O
180
316
316
404
Block RAM Bits
40,960
65,536
98,304
131,072
Max Select
RAM Bits
38,400
98,304
221,184
393,216
R
Virtex Electrical Characteristics
Based on preliminary characterization. Further changes are not expected.
All specifications are representative of worst-case supply voltage and junction temperature conditions. The parameters
included are common to popular designs and typical applications. Contact the factory for design considerations requiring
more detailed information.
Virtex DC Characteristics
Absolute Maximum Ratings
Symbol
V
CCINT
V
CCO
V
REF
V
IN(3)
V
TS
V
CC
T
STG
T
J
Supply voltage relative to GND
Supply voltage relative to GND
Input reference Voltage
Input voltage relative to GND
Using V
REF
Internal threshold
Voltage applied to 3-state output
Longest supply voltage rise time from 1V to 2.375V
Storage temperature (ambient)
Junction temperature
Ceramic packages
Plastic packages
Description
Min/Max
–0.5 to 3.0
–0.5 to 4.0
–0.5 to 3.6
–0.5 to 3.6
–0.5 to 5.5
–0.5 to 5.5
50
–65 to +150
+150
+125
Units
V
V
V
V
V
V
ms
°C
°C
°C
Notes:
1. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
2. Power supplies may turn on in any order.
3. For protracted periods (e.g., longer than a day), V
IN
should not exceed V
CCO
by more that 3.6V.
2
1-800-255-7778
Preliminary Product Specification