X25128
A.C. CONDITIONS OF TEST
EQUIVALENT A.C. LOAD CIRCUIT
Input Pulse Levels
VCC x 0.1 to VCC x 0.9
5V
3V
Input Rise and Fall
Times
10ns
1.44KΩ
1.64KΩ
4.63KΩ
Input and Output
Timing Levels
VCC X 0.5
OUTPUT
1.95KΩ
OUTPUT
100pF
100pF
3091 FM T11
3091 FM F09.1
A.C. OPERATING CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified.)
Data Input Timing
Symbol
fSCK
tCYC
tLEAD
tLAG
tWH
Parameter
Min.
0
Max.
Units
MHz
ns
Clock Frequency
Cycle Time
2
500
250
250
200
200
50
CS Lead Time
ns
CS Lag Time
ns
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Data In Rise Time
Data In Fall Time
HOLD Setup Time
HOLD Hold Time
CS Deselect Time
Write Cycle Time
ns
tWL
ns
tSU
ns
tH
50
ns
(4)
tRI
2
2
µs
(4)
tFI
µs
tHD
tCD
tCS
100
100
2.0
ns
ns
µs
(5)
tWC
10
ms
3091 FM T12.2
Data Output Timing
Symbol
fSCK
tDIS
Parameter
Min.
Max.
2
Units
MHz
ns
Clock Frequency
0
Output Disable Time
250
200
tV
Output Valid from Clock LOW
Output Hold Time
ns
tHO
0
ns
(4)
tRO
Output Rise Time
100
100
ns
(4)
tFO
Output Fall Time
ns
(4)
tLZ
HOLD HIGH to Output in Low Z
HOLD LOW to Output in Low Z
100
100
ns
(4)
tHZ
ns
3091 FM T13.2
Notes: (4) This parameter is periodically sampled and not 100% tested.
(5) t is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal
WC
nonvolatile write cycle.
9