X20C04
ENDURANCE AND DATA RETENTION
Parameter
Min.
Units
Endurance
100,000
1,000,000
100
Data Changes Per Bit
Store Cycles
Years
Store Cycles
Data Retention
3825 PGM T07.1
MODE SELECTION
CE
WE
NE
OE
Mode
I/O
Power
H
L
L
L
L
L
L
L
L
X
H
L
X
H
H
H
L
X
L
Not Selected
Read RAM
Output High Z
Output Data
Standby
Active
Active
Active
Active
Active
Active
Active
Active
H
H
L
Write “1” RAM
Write “0” RAM
Array Recall
Input Data High
Input Data Low
Output High Z
Output High Z
Output High Z
Output High Z
Output High Z
L
H
L
L
H
H
L
Nonvolatile Storing
Output Disabled
Not Allowed
H
L
H
L
H
L
H
No Operation
3825 PGM T09.1
EQUIVALENT A.C. LOAD CIRCUIT
A.C. CONDITIONS OF TEST
Input Pulse Levels
0V to 3V
5V
Input Rise and
Fall Times
10ns
1.5V
1.92KΩ
Input and Output
Timing Levels
OUTPUT
3825 PGM T08.2
1.37KΩ
100pF
3825 FHD F04.1
5