X20C04
ENDURANCE AND DATA RETENTION
Parameter
Endurance
Store Cycles
Data Retention
MODE SELECTION
CE
H
L
L
L
L
L
L
L
L
WE
X
H
L
L
H
L
H
L
H
NE
X
H
H
H
L
L
H
L
L
OE
X
L
H
H
L
H
H
L
H
Mode
Not Selected
Read RAM
Write “1” RAM
Write “0” RAM
Array Recall
Nonvolatile Storing
Output Disabled
Not Allowed
No Operation
I/O
Output High Z
Output Data
Input Data High
Input Data Low
Output High Z
Output High Z
Output High Z
Output High Z
Output High Z
Power
Standby
Active
Active
Active
Active
Active
Active
Active
Active
3825 PGM T09.1
Min.
100,000
1,000,000
100
Units
Data Changes Per Bit
Store Cycles
Years
3825 PGM T07.1
EQUIVALENT A.C. LOAD CIRCUIT
5V
1.92KΩ
OUTPUT
1.37KΩ
100pF
A.C. CONDITIONS OF TEST
Input Pulse Levels
Input Rise and
Fall Times
Input and Output
Timing Levels
0V to 3V
10ns
1.5V
3825 PGM T08.2
3825 FHD F04.1
5