WM8955L
Product Preview
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device maybe caused bycontinuously
operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given
under Electrical Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore genericallysusceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
-0.3V
MAX
+3.63V
Supplyvoltages
Voltage range digital inputs
Voltage range analogue inputs
DGND -0.3V
AGND -0.3V
-25°C
DBVDD +0.3V
AVDD +0.3V
+85°C
Operating temperature range, TA
Storage temperature prior to soldering
Storage temperature after soldering
Package bodytemperature (soldering 10 seconds)
Package bodytemperature (soldering 2 minutes)
Notes
30°C max / 85% RH max
-65°C
+150°C
+260°C
+183°C
1. Analogue and digital grounds must always be within 0.3V of each other.
2. All digital and analogue supplies are completelyindependent from each other.
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
DCVDD
TEST CONDITIONS
MIN
1.42
1.8
TYP
2.0
2.0
2.0
0
MAX
3.6
UNIT
Digital supplyrange (Core)
Digital supplyrange (Buffer)
Analogue supplies range
Ground
V
V
V
V
DBVDD
3.6
AVDD, HPVDD
DGND, AGND, HPGND
1.8
3.6
Product Preview Rev 0.4 May2003
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WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
