WM8802
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AC CHARACTERISTICS
Test Conditions
AC Characteristics at Ta = 25oC, AVDD = DVDD = 3.3V, AGND = DGND = 0V
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
RX0 TO RX6 sampling
frequency
fRFS
28
−
195
kHz
XIN clock frequency
XIN clock frequency
RMCK clock frequency
RMCK clock jitter
fXF1
fXF2
fRCK
tj
1
2
8
20
4
12.288
19
30
100
−
MHz
MHz
MHz
ps
24.576
−
200
−
−
RMCK, RBCK delay
RBCK, RDATA delay
RMCK, SBC delay
tMBO
tBDO
tMBO
tBDO
tWMI
tWBI
fTFS
tDSI
tDHI
tMBI
tBDI
−
10
10
10
10
−
ns
−
−
ns
3
4
−
−
ns
SMCK, RDATA delay
TMCK input pulse width
TBCK input pulse width
TLRCK sampling frequency
TBCK, TDATA setup
TBCK, TDATA hold
TMCK, TBCK delay
TBCK, TDATA delay
−
−
ns
10
40
28
−
−
ns
−
−
ns
−
195
−
kHz
ns
20
20
−
−
−
ns
−
10
10
ns
−
−
ns
Notes:
1.
2.
3.
4.
XINSEL = "0" setting, 12.288MHz must be set when calculating input sampling frequency
XINSEL = "1" setting, 24.576MHz must be set when calculating input sampling frequency
When RMCK and SBCK source clocks are the same
When SBCK is the PLL source clock
RMCK(O)
RBCK(O)
RDATA(O)
tMBO
tBDO
RLRCK(O)
tWMI tWMI
TMCK (I)
tWBI
tMBI
tWBI
tDSI
TBCK(I)
TDATA(I)
TLRCK(I)
tDHI
tBDI
Figure 1 AC Characteristics
PP Rev 1.1 April 2004
8
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
