Production Data
WM8741
TEST CONDITIONS
AVDD = 5V, DVDD = 3.3V, AGND, DGND = 0V, TA = +25oC, 1kHz test signal, fs = 48kHz, MCLK = 512fs unless otherwise
stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Internal Analogue Filter
Bandwidth
-3dB
474
kHz
dB
Passband edge response
Analogue Output Levels
20kHz
-0.0077
PCM full scale differential
output level
Into 10kΩ load, 0dBFS input
Into 10kΩ load, 0dBDSD input
Into 10kΩ load, 0dBDSD input
To midrail or AC coupled
2
VRMS
VRMS
VRMS
kΩ
DSD Direct differential
output level
0.948
0.991
2
DSD Plus differential output
level
Minimum resistance load
Maximum capacitance load
Output DC level
1
nF
V
AVDD/2
Reference Levels
Potential divider resistance
10
kΩ
AVDD to VMIDL/VMIDR and
VMIDL/VMIDR to AGND
Voltage at VMIDL/VMIDR
AVDD/2
V
Notes:
1. Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted over a 20Hz to 20kHz bandwidth.
2. All performance measurements done with 20kHz low pass filter. Failure to use such a filter will result in higher THD
and lower SNR and Dynamic Range readings than are found in the Electrical Characteristics. The low pass filter
removes out of band noise; although it is not audible it may affect dynamic specification values.
PD, Rev 4.2, October 2009
11
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WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
