Production Data
WM2639
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
7V
Digital supply voltages, VDD to GND
Reference input voltage
-0.3V
-0.3V
VDD + 0.3V
VDD + 0.3V
Digital input voltage range to GND
Operating temperature range, TA
°
°
70 C
°
85 C
WM2639CDT
WM2639IDT
0 C
°
-40 C
°
°
Storage temperature
-65 C
150 C
°
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
260 C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
VDD
VIH
VIL
2.7
2
5.5
V
V
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REF
Load resistance
VDD = 2.7V to 5.5V
VDD = 2.7V to 5.5V
See Note
0.8
V
VREF
RL
VDD - 1.5
V
2
kW
pF
°C
°C
Load capacitance
CL
100
70
Operating free-air temperature
TA
WM2639CDT
WM2639IDT
0
-40
85
Note: Reference voltages greater than VDD/2 will cause output saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
Production Data Rev 1.0 July 1999
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
